Ryusuke Sagawa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Estimation model generation method and electron microscope
- Patent number 11,842,880
- Issue date Dec 12, 2023
- Jeol Ltd.
- Ryusuke Sagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring aberration and electron microscope
- Patent number 11,764,029
- Issue date Sep 19, 2023
- Jeol Ltd.
- Shigeyuki Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope and adjustment method of...
- Patent number 11,545,337
- Issue date Jan 3, 2023
- Jeol Ltd.
- Ryusuke Sagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and image acquisition method
- Patent number 10,361,061
- Issue date Jul 23, 2019
- Jeol Ltd.
- Yukihito Kondo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope and method of image gener...
- Patent number 10,340,118
- Issue date Jul 2, 2019
- Jeol Ltd.
- Ryusuke Sagawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Electron Microscope, Aberration Correction Method, And Imaging Method
- Publication number 20240274402
- Publication date Aug 15, 2024
- JEOL Ltd.
- Motofumi Saitoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Method of Correcting Aberration
- Publication number 20230026970
- Publication date Jan 26, 2023
- JEOL Ltd.
- Keito Aibara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Estimation Model Generation Method and Electron Microscope
- Publication number 20220262595
- Publication date Aug 18, 2022
- JEOL Ltd.
- Ryusuke Sagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Measuring Aberration and Electron Microscope
- Publication number 20220230838
- Publication date Jul 21, 2022
- JEOL Ltd.
- Shigeyuki Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Transmission Electron Microscope and Adjustment Method of...
- Publication number 20210335570
- Publication date Oct 28, 2021
- JEOL Ltd.
- Ryusuke Sagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Transmission Electron Microscope and Method of Image Gener...
- Publication number 20180337019
- Publication date Nov 22, 2018
- JEOL Ltd.
- Ryusuke Sagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Image Acquisition Method
- Publication number 20180130634
- Publication date May 10, 2018
- JEOL Ltd.
- Yukihito Kondo
- H01 - BASIC ELECTRIC ELEMENTS

Ryusuke Sagawa

Person

Patents Grantslast 30 patents

Estimation model generation method and electron microscope

Method of measuring aberration and electron microscope

Scanning transmission electron microscope and adjustment method of...

Electron microscope and image acquisition method

Scanning transmission electron microscope and method of image gener...

Patents Applicationslast 30 patents

Electron Microscope, Aberration Correction Method, And Imaging Method

Electron Microscope and Method of Correcting Aberration

Estimation Model Generation Method and Electron Microscope

Method of Measuring Aberration and Electron Microscope

Scanning Transmission Electron Microscope and Adjustment Method of...

Scanning Transmission Electron Microscope and Method of Image Gener...

Electron Microscope and Image Acquisition Method