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Ryusuke Sakai

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  • Kyoto, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Data generating apparatus, data generating method, data generating...
    • Patent number 11,657,303
    • Issue date May 23, 2023
    • Omron Corporation
    • Hiroyuki Mino
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Multifunctional environmental sensor device
    • Patent number 11,549,834
    • Issue date Jan 10, 2023
    • Omron Corporation
    • Hiroyuki Mino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Environment sensor
    • Patent number 11,255,733
    • Issue date Feb 22, 2022
    • Omron Corporation
    • Kayo Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor device
    • Patent number 11,231,301
    • Issue date Jan 25, 2022
    • Omron Corporation
    • Naotsugu Ueda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Environmental sensor
    • Patent number 11,022,624
    • Issue date Jun 1, 2021
    • Omron Corporation
    • Kayo Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Environmental sensor
    • Patent number 10,823,590
    • Issue date Nov 3, 2020
    • Omron Corporation
    • Ryusuke Sakai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Environmental sensor
    • Patent number 10,775,232
    • Issue date Sep 15, 2020
    • Omron Corporation
    • Naotsugu Ueda
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Sensor device
    • Patent number 10,554,440
    • Issue date Feb 4, 2020
    • Omron Corporation
    • Hiroyuki Mino
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Environmental sensor
    • Patent number 10,416,007
    • Issue date Sep 17, 2019
    • Omron Corporation
    • Takanobu Yamauchi
    • B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

  • Information Patent Application

    DATA GENERATING APPARATUS, DATA GENERATING METHOD, DATA GENERATING...
    • Publication number 20210174974
    • Publication date Jun 10, 2021
    • Omron Corporation
    • Hiroyuki MINO
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    DATA GENERATING APPARATUS, DATA GENERATING METHOD, DATA GENERATING...
    • Publication number 20210174225
    • Publication date Jun 10, 2021
    • Omron Corporation
    • Hiroyuki MINO
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    MULTIFUNCTIONAL ENVIRONMENTAL SENSOR DEVICE
    • Publication number 20210088366
    • Publication date Mar 25, 2021
    • Omron Corporation
    • Hiroyuki MINO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SENSOR DEVICE
    • Publication number 20190149355
    • Publication date May 16, 2019
    • Omron Corporation
    • Hiroyuki Mino
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    ENVIRONMENT SENSOR
    • Publication number 20190145834
    • Publication date May 16, 2019
    • Omron Corporation
    • Kayo Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Application

    ENVIRONMENTAL SENSOR
    • Publication number 20180259550
    • Publication date Sep 13, 2018
    • Omron Corporation
    • Kayo NAKAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ENVIRONMENTAL SENSOR
    • Publication number 20180259376
    • Publication date Sep 13, 2018
    • Omron Corporation
    • Takanobu YAMAUCHI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    ENVIRONMENTAL SENSOR
    • Publication number 20180259377
    • Publication date Sep 13, 2018
    • Omron Corporation
    • Ryusuke SAKAI
    • G08 - SIGNALLING
  • Information Patent Application

    ENVIRONMENTAL SENSOR
    • Publication number 20180259386
    • Publication date Sep 13, 2018
    • Omron Corporation
    • Naotsugu UEDA
    • G08 - SIGNALLING
  • Information Patent Application

    SENSOR DEVICE
    • Publication number 20180252558
    • Publication date Sep 6, 2018
    • Omron Corporation
    • Naotsugu Ueda
    • G01 - MEASURING TESTING