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Ryuta Suzuki
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Nakai, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Magnetic disk inspecting method and its system
Patent number
8,654,481
Issue date
Feb 18, 2014
Hitachi High-Technologies Corporation
Ryuta Suzuki
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus for inspecting patterned media disk
Patent number
8,605,278
Issue date
Dec 10, 2013
Hitachi High-Technologies Corporation
Ryuta Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Disk reversing/transporting mechanism and disk tester using the sam...
Patent number
7,975,565
Issue date
Jul 12, 2011
Hitachi High-Technologies Corporation
Ryuta Suzuki
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
INSPECTION METHOD AND DEVICE FOR SAME
Publication number
20120320367
Publication date
Dec 20, 2012
Hitachi High-Technologies Corporation
Yu Yanaka
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTING PATTERNED MEDIA DISK
Publication number
20120154798
Publication date
Jun 21, 2012
Hitachi High-Technologies Corporation
Ryuta SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC DISK INSPECTING METHOD AND ITS SYSTEM
Publication number
20120087040
Publication date
Apr 12, 2012
Ryuta SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTING MAGNETIC DISK
Publication number
20120075624
Publication date
Mar 29, 2012
Hitachi High-Technologies Corporation
Ryuta SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
PATTERN SHAPE INSPECTION INSTRUMENT AND PATTERN SHAPE INSPECTION ME...
Publication number
20110272096
Publication date
Nov 10, 2011
Hitachi High-Technologies Corporation
Shigeru SERIKAWA
G01 - MEASURING TESTING
Information
Patent Application
DISK REVERSING/TRANSPORTING MECHANISM AND DISK TESTER USING THE SAM...
Publication number
20080297944
Publication date
Dec 4, 2008
Ryuta Suzuki
G11 - INFORMATION STORAGE
Information
Patent Application
TESTING METHOD FOR SURFACE DEFECTS ON DISC AND TESTING APPARATUS FO...
Publication number
20070222975
Publication date
Sep 27, 2007
SHIGERU SERIKAWA
G01 - MEASURING TESTING