S. Jay Chey

Person

Hartsdale, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Microchip substance delivery devices
- Patent number 11,000,474
- Issue date May 11, 2021
- International Business Machines Corporation
- S. Jay Chey
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Reconfigurable gas sensor architecture with a high sensitivity at l...
- Patent number 10,697,927
- Issue date Jun 30, 2020
- International Business Machines Corporation
- S. J. Chey
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Reconfigurable gas sensor architecture with a high sensitivity at l...
- Patent number 10,697,928
- Issue date Jun 30, 2020
- International Business Machines Corporation
- S. J. Chey
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Reconfigurable gas sensor architecture with a high sensitivity at l...
- Patent number 10,670,554
- Issue date Jun 2, 2020
- International Business Machines Corporation
- S. J. Chey
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Microchip substance delivery devices having low-power electromechan...
- Patent number 9,937,124
- Issue date Apr 10, 2018
- International Business Machines Corporation
- S. Jay Chey
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Methods and apparatus for detection of gaseous corrosive contaminants
- Patent number 9,575,040
- Issue date Feb 21, 2017
- GLOBALFOUNDRIES Inc.
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Grant
High performance compliant wafer test probe
- Patent number 9,335,346
- Issue date May 10, 2016
- GLOBALFOUNDRIES Inc.
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Grant
Probe-on-substrate
- Patent number 9,057,741
- Issue date Jun 16, 2015
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for managing corrosion in buildings
- Patent number 8,949,040
- Issue date Feb 3, 2015
- International Business Machines Corporation
- S. Jay Chey
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe-on-substrate
- Patent number 8,933,717
- Issue date Jan 13, 2015
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Grant
Electrochemical liquid cell apparatus
- Patent number 8,852,408
- Issue date Oct 7, 2014
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Grant
Silicon chicklet pedestal
- Patent number 8,806,740
- Issue date Aug 19, 2014
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for detection of gaseous corrosive contaminants
- Patent number 8,723,534
- Issue date May 13, 2014
- International Business Machines Corporation
- S. Jay Chey
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Silicon chicklet pedestal
- Patent number 8,595,919
- Issue date Dec 3, 2013
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Grant
High performance compliant wafer test probe
- Patent number 8,487,304
- Issue date Jul 16, 2013
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Grant
Negative thermal expansion system (NTES) device for TCE compensatio...
- Patent number 8,241,957
- Issue date Aug 14, 2012
- International Business Machines Corporation
- Gareth Geoffrey Hougham
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Negative coefficient of thermal expansion particles
- Patent number 8,119,206
- Issue date Feb 21, 2012
- International Business Machines Corporation
- Gareth Geoffrey Hougham
- B32 - LAYERED PRODUCTS
Information Patent Grant
Method of forming silicon chicklet pedestal
- Patent number 7,987,591
- Issue date Aug 2, 2011
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Grant
Negative thermal expansion system (NTEs) device for TCE compensatio...
- Patent number 7,883,919
- Issue date Feb 8, 2011
- International Business Machines Corporation
- Gareth Geoffrey Hougham
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method and process for reducing undercooling in a lead-free tin-ric...
- Patent number 7,784,669
- Issue date Aug 31, 2010
- International Business Machines Corporation
- Gareth G. Hougham
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and process for reducing undercooling in a lead-free tin-ric...
- Patent number 7,703,661
- Issue date Apr 27, 2010
- International Business Machines Corporation
- Gareth G. Hougham
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Negative coefficient of thermal expansion particles and method of f...
- Patent number 7,579,069
- Issue date Aug 25, 2009
- International Business Machines Corporation
- Gareth Geoffrey Hougham
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Negative thermal expansion system (NTEs) device for TCE compensatio...
- Patent number 7,556,979
- Issue date Jul 7, 2009
- International Business Machines Corporation
- Gareth Geoffrey Hougham
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Global vacuum injection molded solder system and method
- Patent number 7,497,366
- Issue date Mar 3, 2009
- International Business Machines Corporation
- S. Jay Chey
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Structure for coupling probes of probe device to corresponding elec...
- Patent number 7,456,640
- Issue date Nov 25, 2008
- International Business Machines Corporation
- Ronald Richard Breton
- G01 - MEASURING TESTING
Information Patent Grant
Negative thermal expansion system (NTEs) device for TCE compensatio...
- Patent number 7,417,315
- Issue date Aug 26, 2008
- International Business Machines Corporation
- Gareth Geoffrey Hougham
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Assembly for thermal and/or thermally-assisted information processing
- Patent number 7,130,141
- Issue date Oct 31, 2006
- Hitachi Global Storage Technologies Netherlands B.V.
- S. Jay Chey
- G11 - INFORMATION STORAGE
Information Patent Grant
Attenuating phase shift mask blank and photomask
- Patent number 7,029,803
- Issue date Apr 18, 2006
- Schott AG
- Hans Becker
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Attenuated embedded phase shift photomask blanks
- Patent number 6,979,518
- Issue date Dec 27, 2005
- International Business Machines Corporation
- Marie Angelopoulos
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Thermal measurements of electronic devices during operation
- Patent number 6,928,380
- Issue date Aug 9, 2005
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROCHIP SUBSTANCE DELIVERY DEVICES HAVING LOW-POWER ELECTROMECHAN...
- Publication number 20180133152
- Publication date May 17, 2018
- International Business Machines Corporation
- S. Jay Chey
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
RECONFIGURABLE GAS SENSOR ARCHITECTURE WITH A HIGH SENSITIVITY AT L...
- Publication number 20170023520
- Publication date Jan 26, 2017
- International Business Machines Corporation
- S. J. Chey
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
RECONFIGURABLE GAS SENSOR ARCHITECTURE WITH A HIGH SENSITIVITY AT L...
- Publication number 20170024992
- Publication date Jan 26, 2017
- International Business Machines Corporation
- S. J. Chey
- G01 - MEASURING TESTING
Information Patent Application
RECONFIGURABLE GAS SENSOR ARCHITECTURE WITH A HIGH SENSITIVITY AT L...
- Publication number 20170016866
- Publication date Jan 19, 2017
- International Business Machines Corporation
- S. J. Chey
- G01 - MEASURING TESTING
Information Patent Application
MICROCHIP SUBSTANCE DELIVERY DEVICES HAVING LOW-POWER ELECTROMECHAN...
- Publication number 20160074323
- Publication date Mar 17, 2016
- International Business Machines Corporation
- S. Jay Chey
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHODS AND APPARATUS FOR DETECTION OF GASEOUS CORROSIVE CONTAMINANTS
- Publication number 20140230524
- Publication date Aug 21, 2014
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Application
PROBE-ON-SUBSTRATE
- Publication number 20130344694
- Publication date Dec 26, 2013
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Application
PROBE-ON-SUBSTRATE
- Publication number 20130342234
- Publication date Dec 26, 2013
- Intenational Business Machines Corporation
- David M. AUDETTE
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Managing Corrosion in Buildings
- Publication number 20130047547
- Publication date Feb 28, 2013
- International Business Machines Corporation
- S. Jay Chey
- F24 - HEATING RANGES VENTILATING
Information Patent Application
High Performance Compliant Wafer Test Probe
- Publication number 20120329295
- Publication date Dec 27, 2012
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Application
MULTISTACK SOLDER WAFER FILLING
- Publication number 20120234902
- Publication date Sep 20, 2012
- International Business Machines Corporation
- S. Jay Chey
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHODS AND APPARATUS FOR DETECTION OF GASEOUS CORROSIVE CONTAMINANTS
- Publication number 20120176148
- Publication date Jul 12, 2012
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Application
High Performance Compliant Wafer Test Probe
- Publication number 20110266539
- Publication date Nov 3, 2011
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Application
SILICON CHICKLET PEDESTAL
- Publication number 20110199108
- Publication date Aug 18, 2011
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Application
SILICON CHICKLET PEDESTAL
- Publication number 20110199109
- Publication date Aug 18, 2011
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Application
MULTISTACK SOLDER WAFER FILLING
- Publication number 20110079632
- Publication date Apr 7, 2011
- International Business Machines Corporation
- S. Jay Chey
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SILICON CHICKLET PEDESTAL
- Publication number 20110037489
- Publication date Feb 17, 2011
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Application
Negative Thermal Expansion System (NTES) Device for TCE Compensatio...
- Publication number 20110034047
- Publication date Feb 10, 2011
- International Business Machines Corporation
- Gareth Geoffrey HOUGHAM
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ELECTROCHEMICAL LIQUID CELL APPARATUS
- Publication number 20100276277
- Publication date Nov 4, 2010
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND PROCESS FOR REDUCING UNDERCOOLING IN A LEAD-FREE TIN-RIC...
- Publication number 20100155456
- Publication date Jun 24, 2010
- International Business Machines Corp.
- GARETH G. HOUGHAM
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Negative Thermal Expansion System (NTES) Device for TCE Compensatio...
- Publication number 20090263991
- Publication date Oct 22, 2009
- Gareth Geoffrey Hougham
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Negative Coefficient of Thermal Expansion Particles and Method of F...
- Publication number 20090214780
- Publication date Aug 27, 2009
- International Business Machines
- Gareth Geoffrey Hougham
- B32 - LAYERED PRODUCTS
Information Patent Application
PROCESS FOR FORMING METAL FILM AND RELEASE LAYER ON POLYMER
- Publication number 20090051026
- Publication date Feb 26, 2009
- International Business Machines Corporation
- S. Jay Chey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND PROCESS FOR REDUCING UNDERCOOLING IN A LEAD-FREE TIN-RIC...
- Publication number 20080290142
- Publication date Nov 27, 2008
- International Business Machines Corporation
- Gareth G. Hougham
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Negative Thermal Expansion System (NTES) Device for TCE Compensatio...
- Publication number 20080048305
- Publication date Feb 28, 2008
- Gareth Geoffrey Hougham
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Injection molded soldering head for high temperature application an...
- Publication number 20080014406
- Publication date Jan 17, 2008
- International Business Machines Corporation
- S. Jay Chey
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
GLOBAL VACUUM INJECTION MOLDED SOLDER SYSTEM AND METHOD
- Publication number 20070246853
- Publication date Oct 25, 2007
- International Business Machines Corporation
- S. JAY CHEY
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Structure for coupling probes of probe device to corresponding elec...
- Publication number 20070200572
- Publication date Aug 30, 2007
- Ronald Richard Breton
- G01 - MEASURING TESTING
Information Patent Application
THERMAL MEASURMENTS OF ELECTRONIC DEVICES DURING OPERATION
- Publication number 20050114068
- Publication date May 26, 2005
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Application
Negative coefficient of thermal expansion particles and method of f...
- Publication number 20050100743
- Publication date May 12, 2005
- International Business Machines Corporation
- Gareth Geoffrey Hougham
- B32 - LAYERED PRODUCTS

S. Jay Chey

Person

Patents Grantslast 30 patents

Microchip substance delivery devices

Reconfigurable gas sensor architecture with a high sensitivity at l...

Reconfigurable gas sensor architecture with a high sensitivity at l...

Reconfigurable gas sensor architecture with a high sensitivity at l...

Microchip substance delivery devices having low-power electromechan...

Methods and apparatus for detection of gaseous corrosive contaminants

High performance compliant wafer test probe

Probe-on-substrate

Methods and apparatus for managing corrosion in buildings

Probe-on-substrate

Electrochemical liquid cell apparatus

Silicon chicklet pedestal

Methods and apparatus for detection of gaseous corrosive contaminants

Silicon chicklet pedestal

High performance compliant wafer test probe

Negative thermal expansion system (NTES) device for TCE compensatio...

Negative coefficient of thermal expansion particles

Method of forming silicon chicklet pedestal

Negative thermal expansion system (NTEs) device for TCE compensatio...

Method and process for reducing undercooling in a lead-free tin-ric...

Method and process for reducing undercooling in a lead-free tin-ric...

Negative coefficient of thermal expansion particles and method of f...

Negative thermal expansion system (NTEs) device for TCE compensatio...

Global vacuum injection molded solder system and method

Structure for coupling probes of probe device to corresponding elec...

Negative thermal expansion system (NTEs) device for TCE compensatio...

Assembly for thermal and/or thermally-assisted information processing

Attenuating phase shift mask blank and photomask

Attenuated embedded phase shift photomask blanks

Thermal measurements of electronic devices during operation

Patents Applicationslast 30 patents

MICROCHIP SUBSTANCE DELIVERY DEVICES HAVING LOW-POWER ELECTROMECHAN...

RECONFIGURABLE GAS SENSOR ARCHITECTURE WITH A HIGH SENSITIVITY AT L...

RECONFIGURABLE GAS SENSOR ARCHITECTURE WITH A HIGH SENSITIVITY AT L...

RECONFIGURABLE GAS SENSOR ARCHITECTURE WITH A HIGH SENSITIVITY AT L...

MICROCHIP SUBSTANCE DELIVERY DEVICES HAVING LOW-POWER ELECTROMECHAN...

METHODS AND APPARATUS FOR DETECTION OF GASEOUS CORROSIVE CONTAMINANTS

PROBE-ON-SUBSTRATE

PROBE-ON-SUBSTRATE

Methods and Apparatus for Managing Corrosion in Buildings

High Performance Compliant Wafer Test Probe

MULTISTACK SOLDER WAFER FILLING

METHODS AND APPARATUS FOR DETECTION OF GASEOUS CORROSIVE CONTAMINANTS

High Performance Compliant Wafer Test Probe

SILICON CHICKLET PEDESTAL

SILICON CHICKLET PEDESTAL

MULTISTACK SOLDER WAFER FILLING

SILICON CHICKLET PEDESTAL

Negative Thermal Expansion System (NTES) Device for TCE Compensatio...

ELECTROCHEMICAL LIQUID CELL APPARATUS

METHOD AND PROCESS FOR REDUCING UNDERCOOLING IN A LEAD-FREE TIN-RIC...

Negative Thermal Expansion System (NTES) Device for TCE Compensatio...

Negative Coefficient of Thermal Expansion Particles and Method of F...

PROCESS FOR FORMING METAL FILM AND RELEASE LAYER ON POLYMER

METHOD AND PROCESS FOR REDUCING UNDERCOOLING IN A LEAD-FREE TIN-RIC...

Negative Thermal Expansion System (NTES) Device for TCE Compensatio...

Injection molded soldering head for high temperature application an...

GLOBAL VACUUM INJECTION MOLDED SOLDER SYSTEM AND METHOD

Structure for coupling probes of probe device to corresponding elec...

THERMAL MEASURMENTS OF ELECTRONIC DEVICES DURING OPERATION

Negative coefficient of thermal expansion particles and method of f...