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S. Sohail H. Naqvi
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Albuquerque, NM, US
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last 30 patents
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Patent Grant
Use of diffracted light from latent images in photoresist for optim...
Patent number
5,830,611
Issue date
Nov 3, 1998
Kenneth P. Bishop
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lens scatterometer system employing source light beam scanning means
Patent number
5,703,692
Issue date
Dec 30, 1997
Bio-Rad Laboratories, Inc.
John R. McNeil
G01 - MEASURING TESTING
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Patent Grant
Diffracted light from latent images in photoresist for exposure con...
Patent number
5,674,652
Issue date
Oct 7, 1997
University of New Mexico
Kenneth P. Bishop
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
Simple CD measurement of periodic structures on photomasks
Patent number
5,164,790
Issue date
Nov 17, 1992
John R. McNeil
G01 - MEASURING TESTING