Saar Shabtay

Person

Mismeret, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Selecting a representative subset of potential defects to improve d...
- Patent number 11,940,390
- Issue date Mar 26, 2024
- Applied Materials Israel Ltd.
- Yotam Sofer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer program product for object examination
- Patent number 11,592,400
- Issue date Feb 28, 2023
- Applied Materials Israel Ltd.
- Saar Shabtay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selecting a coreset of potential defects for estimating expected de...
- Patent number 11,360,030
- Issue date Jun 14, 2022
- Applied Materials Isreal Ltd
- Yotam Sofer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer program product for object examination
- Patent number 10,871,451
- Issue date Dec 22, 2020
- Applied Materials Israel Ltd.
- Saar Shabtay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Iterative defect filtering process
- Patent number 10,818,000
- Issue date Oct 27, 2020
- Applied Materials Israel Ltd.
- Saar Shabtay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Guided inspection of a semiconductor wafer based on systematic defects
- Patent number 10,605,745
- Issue date Mar 31, 2020
- Applied Materials Israel Ltd.
- Yotam Sofer
- G01 - MEASURING TESTING
Information Patent Grant
System, method and computer program product for object examination
- Patent number 10,408,764
- Issue date Sep 10, 2019
- Applied Materials Israel Ltd.
- Saar Shabtay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Iterative defect filtering process
- Patent number 10,049,441
- Issue date Aug 14, 2018
- Applied Materials Israel Ltd.
- Saar Shabtay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Iterative defect filtering process
- Patent number 9,286,675
- Issue date Mar 15, 2016
- Applied Materials Israel Ltd.
- Saar Shabtay
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF
- Publication number 20220291138
- Publication date Sep 15, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yotam SOFER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF
- Publication number 20210239623
- Publication date Aug 5, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Yotam SOFER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR OBJECT EXAMINATION
- Publication number 20210109029
- Publication date Apr 15, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Saar SHABTAY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GUIDED INSPECTION OF A SEMICONDUCTOR WAFER BASED ON SYSTEMATIC DEFECTS
- Publication number 20200003700
- Publication date Jan 2, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Yotam Sofer
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR OBJECT EXAMINATION
- Publication number 20190391085
- Publication date Dec 26, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Saar SHABTAY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR OBJECT EXAMINATION
- Publication number 20190079022
- Publication date Mar 14, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Saar SHABTAY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ITERATIVE DEFECT FILTERING PROCESS
- Publication number 20190012781
- Publication date Jan 10, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Saar Shabtay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ITERATIVE DEFECT FILTERING PROCESS
- Publication number 20160163038
- Publication date Jun 9, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Saar Shabtay
- G06 - COMPUTING CALCULATING COUNTING

Saar Shabtay

Person

Patents Grantslast 30 patents

Selecting a representative subset of potential defects to improve d...

System, method and computer program product for object examination

Selecting a coreset of potential defects for estimating expected de...

System, method and computer program product for object examination

Iterative defect filtering process

Guided inspection of a semiconductor wafer based on systematic defects

System, method and computer program product for object examination

Iterative defect filtering process

Iterative defect filtering process

Patents Applicationslast 30 patents

METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF

METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR OBJECT EXAMINATION

GUIDED INSPECTION OF A SEMICONDUCTOR WAFER BASED ON SYSTEMATIC DEFECTS

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR OBJECT EXAMINATION

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR OBJECT EXAMINATION

ITERATIVE DEFECT FILTERING PROCESS

ITERATIVE DEFECT FILTERING PROCESS