Sabyasachi Bhattacharya

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New York, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Scanning AC hall microscope
- Patent number 6,396,261
- Issue date May 28, 2002
- NEC Research Institute, Inc.
- Maxim Martchevskii
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Reduction of imprint in ferroelectric devices using a depoling tech...
- Patent number 6,392,919
- Issue date May 21, 2002
- NEC Research Institute, Inc.
- Mark J. Higgins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduction of imprint in ferroelectric devices using a depoling tech...
- Patent number 6,294,393
- Issue date Sep 25, 2001
- NEC Research Institute, Inc.
- Mark J. Higgins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switch useful at superconducting temperatures and comprising superc...
- Patent number 6,184,765
- Issue date Feb 6, 2001
- NEC Research Institute, Inc.
- Sabyasachi Bhattacharya
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Piezo-noise microscope and methods for use thereof
- Publication number 20030234358
- Publication date Dec 25, 2003
- NEC Research Institute, Inc.
- Mark J. Higgins
- G01 - MEASURING TESTING