Sachihiro NAKAGAWA

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Nagaoka-shi, Niigata-ken, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection apparatus
- Patent number 10,859,516
- Issue date Dec 8, 2020
- System Square Inc.
- Noriaki Ikeda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TRAINING DATA GENERATION DEVICE, INSPECTION DEVICE AND PROGRAM
- Publication number 20220318985
- Publication date Oct 6, 2022
- Sachihiro NAKAGAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRAINING DATA GENERATION DEVICE AND TRAINING DATA GENERATION PROGRAM
- Publication number 20220067434
- Publication date Mar 3, 2022
- SYSTEM SQUARE INC.
- Sachihiro NAKAGAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20190212464
- Publication date Jul 11, 2019
- System Square Inc.
- Noriaki IKEDA
- G01 - MEASURING TESTING