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Sachiko Yabe
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Ibaraki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Fabrication method for device structure having transparent dielectr...
Patent number
8,076,220
Issue date
Dec 13, 2011
Oki Semiconductor Co., Ltd.
Toshiyuki Nakamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dielectric substrate with reflecting films
Patent number
7,745,880
Issue date
Jun 29, 2010
Oki Semiconductor Co., Ltd.
Toshiyuki Nakamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for manufacturing electronic device
Patent number
7,439,171
Issue date
Oct 21, 2008
NEC Electronics Corporation
Eiichi Soda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Focus monitoring method
Patent number
7,388,651
Issue date
Jun 17, 2008
Oki Electric Industry Co., Ltd.
Sachiko Yabe
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of forming alignment marks for semiconductor device fabrication
Patent number
7,332,405
Issue date
Feb 19, 2008
Oki Electric Industry Co., Ltd.
Sachiko Yabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing an alignment mark
Patent number
6,809,002
Issue date
Oct 26, 2004
Oki Electric Industry Co., Ltd.
Sachiko Yabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photoresist developing nozzle, photoresist developing apparatus, an...
Patent number
6,572,285
Issue date
Jun 3, 2003
Oki Electric Industry Co., Ltd.
Sachiko Yabe
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of measuring film thickness distribution
Patent number
6,349,594
Issue date
Feb 26, 2002
Oki Electric Industry Co., Ltd.
Sachiko Yabe
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
FABRICATION METHOD FOR DEVICE STRUCTURE HAVING TRANSPARENT DIELECTR...
Publication number
20100240195
Publication date
Sep 23, 2010
OKI SEMICONDUCTOR CO., LTD.
Toshiyuki Nakamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Focus monitoring method
Publication number
20060103823
Publication date
May 18, 2006
Oki Electric Industry Co., Ltd.
Sachiko Yabe
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Semiconductor device structure and fabrication process
Publication number
20060102975
Publication date
May 18, 2006
Toshiyuki Nakamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for manufacturing electonic device
Publication number
20060094234
Publication date
May 4, 2006
Eiichi Soda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of forming alignment marks for semiconductor device fabrication
Publication number
20050186756
Publication date
Aug 25, 2005
Sachiko Yabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of manufacturing an alignment mark
Publication number
20020182821
Publication date
Dec 5, 2002
Sachiko Yabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Photoresist developing nozzle, photoresist developing apparatus, an...
Publication number
20020043541
Publication date
Apr 18, 2002
Sachiko Yabe
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY