Sachio Hayashi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Circuit design support apparatus and circuit design support method
- Patent number 10,482,213
- Issue date Nov 19, 2019
- Kabushiki Kaisha Toshiba
- Sachio Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device, semiconductor chip, and method of manufacturi...
- Patent number 9,633,969
- Issue date Apr 25, 2017
- Kabushiki Kaisha Toshiba
- Sachio Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD analysis apparatus
- Patent number 8,819,614
- Issue date Aug 26, 2014
- Kabushiki Kaisha Toshiba
- Sachio Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrostatic discharge testing method and semiconductor device fab...
- Patent number 7,512,916
- Issue date Mar 31, 2009
- Kabushiki Kaisha Toshiba
- Sachio Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis apparatus for semiconductor LSI circuit electrostatic disc...
- Patent number 7,340,699
- Issue date Mar 4, 2008
- Kabushiki Kaisha Toshiba
- Sachio Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of analyzing semiconductor LSI circuit electrostatic discharge
- Patent number 7,114,137
- Issue date Sep 26, 2006
- Kabushiki Kaisha Toshiba
- Sachio Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for analyzing EMI noise and semiconductor device
- Patent number 6,842,727
- Issue date Jan 11, 2005
- Kabushiki Kaisha Toshiba
- Sachio Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Layout pattern generation device for semiconductor integrated circu...
- Patent number 5,974,244
- Issue date Oct 26, 1999
- Kabushiki Kaisha Toshiba
- Sachio Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of compacting layouts of semiconductor integrated circuit de...
- Patent number 5,663,892
- Issue date Sep 2, 1997
- Kabushiki Kaisha Toshiba
- Sachio Hayashi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT DESIGN SUPPORT APPARATUS AND CIRCUIT DESIGN SUPPORT METHOD
- Publication number 20190294752
- Publication date Sep 26, 2019
- KABUSHIKI KAISHA TOSHIBA
- Sachio HAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE, SEMICONDUCTOR CHIP, AND METHOD OF MANUFACTURI...
- Publication number 20170077060
- Publication date Mar 16, 2017
- Kabushiki Kaisha Toshiba
- Sachio Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD ANALYSIS APPARATUS
- Publication number 20140013296
- Publication date Jan 9, 2014
- Kabushiki Kaisha Toshiba
- Sachio HAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CLOCK JITTER ANALYZING METHOD AND APPARATUS
- Publication number 20110295536
- Publication date Dec 1, 2011
- Kabushiki Kaisha Toshiba
- Tomoyuki YODA
- G01 - MEASURING TESTING
Information Patent Application
Electrostatic discharge testing method and semiconductor device fab...
- Publication number 20060109596
- Publication date May 25, 2006
- Sachio Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analysis apparatus for semiconductor LSI circuit
- Publication number 20050146380
- Publication date Jul 7, 2005
- Sachio Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of analyzing semiconductor LSI circuit electrostatic discharge
- Publication number 20050010879
- Publication date Jan 13, 2005
- Sachio Hayashi
- G06 - COMPUTING CALCULATING COUNTING

Sachio Hayashi

Person

Patents Grantslast 30 patents

Circuit design support apparatus and circuit design support method

Semiconductor device, semiconductor chip, and method of manufacturi...

ESD analysis apparatus

Electrostatic discharge testing method and semiconductor device fab...

Analysis apparatus for semiconductor LSI circuit electrostatic disc...

Method of analyzing semiconductor LSI circuit electrostatic discharge

Device and method for analyzing EMI noise and semiconductor device

Layout pattern generation device for semiconductor integrated circu...

Method of compacting layouts of semiconductor integrated circuit de...

Patents Applicationslast 30 patents

CIRCUIT DESIGN SUPPORT APPARATUS AND CIRCUIT DESIGN SUPPORT METHOD

SEMICONDUCTOR DEVICE, SEMICONDUCTOR CHIP, AND METHOD OF MANUFACTURI...

ESD ANALYSIS APPARATUS

CLOCK JITTER ANALYZING METHOD AND APPARATUS

Electrostatic discharge testing method and semiconductor device fab...

Analysis apparatus for semiconductor LSI circuit

Method of analyzing semiconductor LSI circuit electrostatic discharge