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Sachio MURAKAMI
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Kyoto-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Sample-analyzing system
Patent number
10,539,520
Issue date
Jan 21, 2020
Shimadzu Corporation
Sachio Murakami
G01 - MEASURING TESTING
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Patent Grant
Foreign substance analysis system
Patent number
10,126,250
Issue date
Nov 13, 2018
Shimadzu Corporation
Sachio Murakami
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SPECTRUM ANALYSIS SYSTEM AND SPECTRUM ANALYSIS METHOD
Publication number
20240175813
Publication date
May 30, 2024
Shimadzu Corporation
Risa FUJI
G01 - MEASURING TESTING
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Patent Application
SAMPLE-ANALYZING SYSTEM
Publication number
20170307551
Publication date
Oct 26, 2017
Shimadzu Corporation
Sachio MURAKAMI
G01 - MEASURING TESTING