Sadami Takeoka

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit, and designing method and testing...
- Patent number 7,613,972
- Issue date Nov 3, 2009
- Panasonic Corporation
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit and method for testing the same
- Patent number 7,610,533
- Issue date Oct 27, 2009
- Panasonic Corporation
- Takashi Ishimura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit and method for testing the same
- Patent number 7,590,908
- Issue date Sep 15, 2009
- Panasonic Corporation
- Takashi Ishimura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit and method for testing the same
- Patent number 7,512,853
- Issue date Mar 31, 2009
- Panasonic Corporation
- Takashi Ishimura
Information Patent Grant
Method of designing semiconductor integrated circuit in which fault...
- Patent number 7,475,378
- Issue date Jan 6, 2009
- Panasonic Corporation
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wiring substrate, semiconductor device, method for te...
- Patent number 7,348,595
- Issue date Mar 25, 2008
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods for evaluating quality of test sequences for delay faults a...
- Patent number 7,302,658
- Issue date Nov 27, 2007
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device, method of testing the same...
- Patent number 7,203,913
- Issue date Apr 10, 2007
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit and testing method for the same
- Patent number 7,197,725
- Issue date Mar 27, 2007
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor wiring substrate, semiconductor device, method for te...
- Patent number 7,171,600
- Issue date Jan 30, 2007
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for evaluating delay test quality
- Patent number 7,159,143
- Issue date Jan 2, 2007
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wiring substrate, semiconductor device, method for te...
- Patent number 7,032,196
- Issue date Apr 18, 2006
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of designing semiconductor integrated circuit utilizing a sc...
- Patent number 7,017,135
- Issue date Mar 21, 2006
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Grant
Method for generating test pattern for semiconductor integrated cir...
- Patent number 6,799,292
- Issue date Sep 28, 2004
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having a device for testing the semiconductor
- Patent number 6,734,549
- Issue date May 11, 2004
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Functional block for integrated circuit, semiconductor integrated c...
- Patent number 6,708,301
- Issue date Mar 16, 2004
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit device, method of testing the same...
- Patent number 6,625,784
- Issue date Sep 23, 2003
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Database for designing integrated circuit device, and method for de...
- Patent number 6,615,389
- Issue date Sep 2, 2003
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inserting test circuit and method for converting test data
- Patent number 6,499,125
- Issue date Dec 24, 2002
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Method of generating test pattern for semiconductor integrated circ...
- Patent number 6,427,218
- Issue date Jul 30, 2002
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Grant
Method of designing semiconductor integrated circuit
- Patent number 6,282,506
- Issue date Aug 28, 2001
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit and method for testing the semicon...
- Patent number 6,271,677
- Issue date Aug 7, 2001
- Matsushita Electric Industrial Company, Limited
- Mitsuyasu Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit, method for designing the same, an...
- Patent number 6,205,566
- Issue date Mar 20, 2001
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for generating test pattern for sequential log...
- Patent number 5,430,736
- Issue date Jul 4, 1995
- Matsushita Electric Industrial, Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR TESTING THE SAME
- Publication number 20090164860
- Publication date Jun 25, 2009
- PANASONIC CORPORATION
- Takashi Ishimura
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DESIGNING SEMICONDUCTOR INTEGRATED CIRCUIT IN WHICH FAULT...
- Publication number 20090106721
- Publication date Apr 23, 2009
- PANASONIC CORPORATION
- Sadami TAKEOKA
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit and testing method for the same
- Publication number 20070250284
- Publication date Oct 25, 2007
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor integrated circuit, and designing method and testing...
- Publication number 20070113131
- Publication date May 17, 2007
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit device, method of testing the same...
- Publication number 20070106965
- Publication date May 10, 2007
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Design data structure for semiconductor integrated circuit and appa...
- Publication number 20070038908
- Publication date Feb 15, 2007
- Yoko Hirano
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit and method for testing the same
- Publication number 20060174176
- Publication date Aug 3, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Takashi Ishimura
- G01 - MEASURING TESTING
Information Patent Application
Method of designing semiconductor integrated circuit
- Publication number 20050188340
- Publication date Aug 25, 2005
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Method for evaluating delay test quality
- Publication number 20050028051
- Publication date Feb 3, 2005
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Methods for evaluating quality of test sequences for delay faults a...
- Publication number 20050010839
- Publication date Jan 13, 2005
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wiring substrate, semiconductor device, method for te...
- Publication number 20040197941
- Publication date Oct 7, 2004
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wiring substrate, semiconductor device, method for te...
- Publication number 20040199840
- Publication date Oct 7, 2004
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wiring substrate, semiconductor device, method for te...
- Publication number 20040195672
- Publication date Oct 7, 2004
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Functional block for integrated circuit, semiconductor integrated c...
- Publication number 20040139376
- Publication date Jul 15, 2004
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor integrated circuit device, method of testing the same...
- Publication number 20030046643
- Publication date Mar 6, 2003
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wiring substrate, semiconductor device, method for te...
- Publication number 20030025191
- Publication date Feb 6, 2003
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit and testing method for the same
- Publication number 20030021464
- Publication date Jan 30, 2003
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Method of generating test pattern for semiconductor integrated circ...
- Publication number 20020013921
- Publication date Jan 31, 2002
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Method for generating test pattern for semiconductor integrated cir...
- Publication number 20010029593
- Publication date Oct 11, 2001
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Method of edsigning semiconductor integrated circuit
- Publication number 20010021990
- Publication date Sep 13, 2001
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING

Sadami Takeoka

Person

Patents Grantslast 30 patents

Semiconductor integrated circuit, and designing method and testing...

Semiconductor integrated circuit and method for testing the same

Semiconductor integrated circuit and method for testing the same

Semiconductor integrated circuit and method for testing the same

Method of designing semiconductor integrated circuit in which fault...

Semiconductor wiring substrate, semiconductor device, method for te...

Methods for evaluating quality of test sequences for delay faults a...

Semiconductor integrated circuit device, method of testing the same...

Semiconductor integrated circuit and testing method for the same

Semiconductor wiring substrate, semiconductor device, method for te...

Method for evaluating delay test quality

Semiconductor wiring substrate, semiconductor device, method for te...

Method of designing semiconductor integrated circuit utilizing a sc...

Method for generating test pattern for semiconductor integrated cir...

Semiconductor device having a device for testing the semiconductor

Functional block for integrated circuit, semiconductor integrated c...

Semiconductor integrated circuit device, method of testing the same...

Database for designing integrated circuit device, and method for de...

Method for inserting test circuit and method for converting test data

Method of generating test pattern for semiconductor integrated circ...

Method of designing semiconductor integrated circuit

Semiconductor integrated circuit and method for testing the semicon...

Semiconductor integrated circuit, method for designing the same, an...

Method and apparatus for generating test pattern for sequential log...

Patents Applicationslast 30 patents

SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR TESTING THE SAME

METHOD OF DESIGNING SEMICONDUCTOR INTEGRATED CIRCUIT IN WHICH FAULT...

Semiconductor integrated circuit and testing method for the same

Semiconductor integrated circuit, and designing method and testing...

Semiconductor integrated circuit device, method of testing the same...

Design data structure for semiconductor integrated circuit and appa...

Semiconductor integrated circuit and method for testing the same

Method of designing semiconductor integrated circuit

Method for evaluating delay test quality

Methods for evaluating quality of test sequences for delay faults a...

Semiconductor wiring substrate, semiconductor device, method for te...

Semiconductor wiring substrate, semiconductor device, method for te...

Semiconductor wiring substrate, semiconductor device, method for te...

Functional block for integrated circuit, semiconductor integrated c...

Semiconductor integrated circuit device, method of testing the same...

Semiconductor wiring substrate, semiconductor device, method for te...

Semiconductor integrated circuit and testing method for the same

Method of generating test pattern for semiconductor integrated circ...

Method for generating test pattern for semiconductor integrated cir...

Method of edsigning semiconductor integrated circuit