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Sadayuki Matsumiya

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  • Kanagawa, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Measuring X-ray CT apparatus and tomographic image generating method
    • Patent number 11,234,670
    • Issue date Feb 1, 2022
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Measuring head
    • Patent number 10,551,184
    • Issue date Feb 4, 2020
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Display device for hardness tester
    • Patent number D848867
    • Issue date May 21, 2019
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Hardness tester
    • Patent number D848882
    • Issue date May 21, 2019
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Hardness tester
    • Patent number D848883
    • Issue date May 21, 2019
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Surface texture measuring apparatus
    • Patent number 10,295,337
    • Issue date May 21, 2019
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Hardness tester
    • Patent number D847674
    • Issue date May 7, 2019
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Hardness tester
    • Patent number D847676
    • Issue date May 7, 2019
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Hardness tester
    • Patent number D847675
    • Issue date May 7, 2019
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Chromatic confocal sensor
    • Patent number 10,197,382
    • Issue date Feb 5, 2019
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method and device for controlling rotary table
    • Patent number 10,190,996
    • Issue date Jan 29, 2019
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring probe and measuring probe system
    • Patent number 10,161,743
    • Issue date Dec 25, 2018
    • Mitutoyo Corporation
    • Kazuhiko Hidaka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe head rotating mechanism
    • Patent number 10,113,851
    • Issue date Oct 30, 2018
    • Mitutoyo Corporation
    • Yoshikazu Ooyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Variable focal length lens
    • Patent number D829261
    • Issue date Sep 25, 2018
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D16 - Photography and optical equipment
  • Information Patent Grant

    Probe for remote coordinate measuring machine
    • Patent number D827459
    • Issue date Sep 4, 2018
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Wireless communication device
    • Patent number D825557
    • Issue date Aug 14, 2018
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D14 - Recording, communication, or information retrieval equipment
  • Information Patent Grant

    Wireless communication device
    • Patent number D821393
    • Issue date Jun 26, 2018
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D14 - Recording, communication, or information retrieval equipment
  • Information Patent Grant

    Measuring probe and measuring probe system
    • Patent number 10,001,358
    • Issue date Jun 19, 2018
    • Mitutoyo Corporation
    • Kazuhiko Hidaka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Connection device for communication
    • Patent number D819631
    • Issue date Jun 5, 2018
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D14 - Recording, communication, or information retrieval equipment
  • Information Patent Grant

    Image measuring device
    • Patent number D806586
    • Issue date Jan 2, 2018
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Image measuring device
    • Patent number D806585
    • Issue date Jan 2, 2018
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Optical measurement head for coordinate measurement
    • Patent number D805409
    • Issue date Dec 19, 2017
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Digital measuring gauge
    • Patent number D792251
    • Issue date Jul 18, 2017
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Digital dial gauge
    • Patent number D790379
    • Issue date Jun 27, 2017
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Image measuring device
    • Patent number D783424
    • Issue date Apr 11, 2017
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Caliper
    • Patent number D774928
    • Issue date Dec 27, 2016
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Form measuring machine
    • Patent number 9,518,811
    • Issue date Dec 13, 2016
    • Mitutoyo Corporation
    • Takeshi Yamamoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring instrument with a graphical user interface
    • Patent number D766920
    • Issue date Sep 20, 2016
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D14 - Recording, communication, or information retrieval equipment
  • Information Patent Grant

    Micrometer
    • Patent number 9,372,059
    • Issue date Jun 21, 2016
    • Mitutoyo Corporation
    • Yoshiro Asano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring instrument with a graphical user interface
    • Patent number D759669
    • Issue date Jun 21, 2016
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D14 - Recording, communication, or information retrieval equipment

Patents Applicationslast 30 patents