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Tokyo, JP
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last 30 patents
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Patent Grant
Semiconductor test apparatus and control method therefor
Patent number
7,356,435
Issue date
Apr 8, 2008
Advantest Corporation
Kazuhiko Sato
G11 - INFORMATION STORAGE
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last 30 patents
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Patent Application
Semiconductor test apparatus and control method therefor
Publication number
20060092755
Publication date
May 4, 2006
Advantest Corporation
Kazuhiko Sato
G01 - MEASURING TESTING