Sagar A. Kekare

Person

Plano, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for inspection of wafers and reticles using des...
- Patent number 11,348,222
- Issue date May 31, 2022
- KLA-Tencor Technologies Corp.
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for inspection of wafers and reticles using des...
- Patent number 10,713,771
- Issue date Jul 14, 2020
- KLA-Tencor Technologies Corp.
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrically relevant placement of metrology targets using design a...
- Patent number 10,303,839
- Issue date May 28, 2019
- KLA-Tencor Corporation
- Sagar A. Kekare
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for defect classification based on electrical des...
- Patent number 10,209,628
- Issue date Feb 19, 2019
- KLA-Tencor Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive electrical testing of wafers
- Patent number 9,689,923
- Issue date Jun 27, 2017
- KLA-Tencor Corp.
- Sagar A. Kekare
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Extracting comprehensive design guidance for in-line process contro...
- Patent number 9,400,865
- Issue date Jul 26, 2016
- KLA-Tencor Corp.
- Sagar A. Kekare
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for utilizing design data in combination with i...
- Patent number 9,401,014
- Issue date Jul 26, 2016
- KLA-Tencor Technologies Corp.
- Khurram Zafar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for inspection of wafers and reticles using des...
- Patent number 9,002,497
- Issue date Apr 7, 2015
- KLA-Tencor Technologies Corp.
- William Volk
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for utilizing design data in combination with i...
- Patent number 8,923,600
- Issue date Dec 30, 2014
- KLA-Tencor Technologies Corp.
- Khurram Zafar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Targeted production control using multivariate analysis of design m...
- Patent number 8,549,445
- Issue date Oct 1, 2013
- Synopsys, Inc.
- Sagar Kekare
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for detecting defects in a reticle design pattern
- Patent number 7,769,225
- Issue date Aug 3, 2010
- KLA-Tencor Technologies Corp.
- Sagar A. Kekare
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for utilizing design data in combination with i...
- Patent number 7,570,796
- Issue date Aug 4, 2009
- KLA-Tencor Technologies Corp.
- Khurram Zafar
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...
- Publication number 20200074619
- Publication date Mar 5, 2020
- KLA-Tencor Technologies Corporation
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...
- Publication number 20180247403
- Publication date Aug 30, 2018
- KLA-Tencor Technologies Corporation
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electrically Relevant Placement of Metrology Targets Using Design A...
- Publication number 20170351804
- Publication date Dec 7, 2017
- KLA-Tencor Corporation
- Sagar A. Kekare
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Defect Classification Based on Electrical Des...
- Publication number 20170344695
- Publication date Nov 30, 2017
- KLA-Tencor Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Extracting Comprehensive Design Guidance for In-Line Process Contro...
- Publication number 20150363537
- Publication date Dec 17, 2015
- KLA-Tencor Corporation
- Sagar A. Kekare
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Inspection of Wafers and Reticles Using Des...
- Publication number 20150178914
- Publication date Jun 25, 2015
- KLA-Tencor Technologies Corporation
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Utilizing Design Data in Combination with I...
- Publication number 20150154746
- Publication date Jun 4, 2015
- KLA-Tencor Technologies Corporation
- Khurram Zafar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Adaptive Electrical Testing of Wafers
- Publication number 20150039954
- Publication date Feb 5, 2015
- KLA-Tencor Corporation
- Sagar A. Kekare
- G01 - MEASURING TESTING
Information Patent Application
TARGETED PRODUCTION CONTROL USING MULTIVARIATE ANALYSIS OF DESIGN M...
- Publication number 20120131527
- Publication date May 24, 2012
- Synopsys, Inc.
- Sagar Kekare
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH I...
- Publication number 20090297019
- Publication date Dec 3, 2009
- KLA-Tencor Technologies Corporation
- Khurram Zafar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...
- Publication number 20080081385
- Publication date Apr 3, 2008
- Paul Frank Marella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH I...
- Publication number 20070288219
- Publication date Dec 13, 2007
- Khurram Zafar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and systems for detecting defects in a reticle design pattern
- Publication number 20070035728
- Publication date Feb 15, 2007
- Sagar A. Kekare
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for inspection of wafers and reticles using des...
- Publication number 20050004774
- Publication date Jan 6, 2005
- William Volk
- G06 - COMPUTING CALCULATING COUNTING

Sagar A. Kekare

Person

Patents Grantslast 30 patents

Methods and systems for inspection of wafers and reticles using des...

Methods and systems for inspection of wafers and reticles using des...

Electrically relevant placement of metrology targets using design a...

System and method for defect classification based on electrical des...

Adaptive electrical testing of wafers

Extracting comprehensive design guidance for in-line process contro...

Methods and systems for utilizing design data in combination with i...

Methods and systems for inspection of wafers and reticles using des...

Methods and systems for utilizing design data in combination with i...

Targeted production control using multivariate analysis of design m...

Methods and systems for detecting defects in a reticle design pattern

Methods and systems for utilizing design data in combination with i...

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...

METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...

Electrically Relevant Placement of Metrology Targets Using Design A...

System and Method for Defect Classification Based on Electrical Des...

Extracting Comprehensive Design Guidance for In-Line Process Contro...

Methods and Systems for Inspection of Wafers and Reticles Using Des...

Methods and Systems for Utilizing Design Data in Combination with I...

Adaptive Electrical Testing of Wafers

TARGETED PRODUCTION CONTROL USING MULTIVARIATE ANALYSIS OF DESIGN M...

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH I...

METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DES...

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH I...

Methods and systems for detecting defects in a reticle design pattern

Methods and systems for inspection of wafers and reticles using des...