Sagar BHOGELA

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Bangalore, IN

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Patents Grantslast 30 patents

Information Patent Grant
Methodology for testing integrated circuits
- Patent number 9,304,163
- Issue date Apr 5, 2016
- QUALCOMM Incorporated
- Sagar Bhogela
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODOLOGY FOR TESTING INTEGRATED CIRCUITS
- Publication number 20150123696
- Publication date May 7, 2015
- QUALCOMM Incorporated
- Sagar BHOGELA
- G01 - MEASURING TESTING