SAGAR KATARIA

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Noida, IN

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Patents Grantslast 30 patents

Information Patent Grant
LBIST debug controller
- Patent number 9,766,289
- Issue date Sep 19, 2017
- NXP USA, INC.
- Mayank Parasrampuria
- G01 - MEASURING TESTING
Information Patent Grant
Scan wrapper circuit for integrated circuit
- Patent number 9,568,551
- Issue date Feb 14, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Sagar Kataria
- G01 - MEASURING TESTING
Information Patent Grant
Method of generating test patterns for detecting small delay defects
- Patent number 9,201,116
- Issue date Dec 1, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Anurag Jindal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LBIST DEBUG CONTROLLER
- Publication number 20170097388
- Publication date Apr 6, 2017
- FREESCALE SEMICONDUCTOR, INC.
- MAYANK PARASRAMPURIA
- G01 - MEASURING TESTING