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Sai Vishwanthaiah
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Sunnyvale, CA, US
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last 30 patents
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Patent Grant
Method and apparatus for sharing an input/output terminal by multip...
Patent number
7,271,613
Issue date
Sep 18, 2007
Advanced Micro Devices, Inc.
Ross Voigt La Fetra
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for testing and debugging a circuit
Patent number
6,751,764
Issue date
Jun 15, 2004
Sun Microsystems, Inc.
Farideh Golshan
G01 - MEASURING TESTING