Saibal Banerjee

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for generation of wafer inspection critical areas
- Patent number 11,410,291
- Issue date Aug 9, 2022
- KLA Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shape metric based scoring of wafer locations
- Patent number 10,714,366
- Issue date Jul 14, 2020
- KLA-Tencor Corp.
- Saibal Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generation of wafer inspection critical areas
- Patent number 10,706,522
- Issue date Jul 7, 2020
- KLA-Tencor Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Criticality analysis augmented process window qualification sampling
- Patent number 10,503,078
- Issue date Dec 10, 2019
- KLA-Tencor Corporation
- Jagdish Chandra Saraswatula
- G01 - MEASURING TESTING
Information Patent Grant
Virtual inspection systems with multiple modes
- Patent number 10,416,088
- Issue date Sep 17, 2019
- KLA-Tencor Corp.
- Brian Duffy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image based specimen process control
- Patent number 10,181,185
- Issue date Jan 15, 2019
- KLA-Tencor Corp.
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect sensitivity of semiconductor wafer inspectors using design d...
- Patent number 10,127,651
- Issue date Nov 13, 2018
- KLA-Tencor Corporation
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reducing registration and design vicinity induced noise for intra-d...
- Patent number 10,074,167
- Issue date Sep 11, 2018
- KLA-Tencor Corporation
- Saibal Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shape based grouping
- Patent number 9,965,848
- Issue date May 8, 2018
- KLA-Tencor Corporation
- Saibal Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Virtual inspection systems with multiple modes
- Patent number 9,816,939
- Issue date Nov 14, 2017
- KLA-Tencor Corp.
- Brian Duffy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Outlier detection on pattern of interest image populations
- Patent number 9,767,548
- Issue date Sep 19, 2017
- KLA-Tencor Corp.
- Saibal Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive sampling for semiconductor inspection recipe creation, def...
- Patent number 9,098,891
- Issue date Aug 4, 2015
- KLA-Tencor Corp.
- Ashok V. Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stream basis set division multiplexing
- Patent number 8,767,734
- Issue date Jul 1, 2014
- BCK Networks, Inc.
- Raghava Kondepudy
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multi-neighbor proportional forwarding in a network
- Patent number 8,432,830
- Issue date Apr 30, 2013
- BCK Networks, Inc.
- Saibal Banerjee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Routing table for non-uniform random neighbor selection
- Patent number 8,396,066
- Issue date Mar 12, 2013
- BCK Networks, Inc.
- Saibal Banerjee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods, defect review tools, and systems for locating a defect in...
- Patent number 7,747,062
- Issue date Jun 29, 2010
- KLA-Tencor Technologies Corp.
- Da Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power assisted automatic supervised classifier creation tool for se...
- Patent number 6,999,614
- Issue date Feb 14, 2006
- KLA-Tencor Corporation
- David Bakker
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Generation of Wafer Inspection Critical Areas
- Publication number 20200334807
- Publication date Oct 22, 2020
- KLA Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPE METRIC BASED SCORING OF WAFER LOCATIONS
- Publication number 20190318949
- Publication date Oct 17, 2019
- KLA-Tencor Corporation
- Saibal Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CRITICALITY ANALYSIS AUGMENTED PROCESS WINDOW QUALIFICATION SAMPLING
- Publication number 20190072858
- Publication date Mar 7, 2019
- KLA-Tencor Corporation
- Jagdish Chandra SARASWATULA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and Method for Generation of Wafer Inspection Critical Areas
- Publication number 20180130195
- Publication date May 10, 2018
- KLA-Tencor Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VIRTUAL INSPECTION SYSTEMS WITH MULTIPLE MODES
- Publication number 20180052118
- Publication date Feb 22, 2018
- KLA-Tencor Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
DEFECT SENSITIVITY OF SEMICONDUCTOR WAFER INSPECTORS USING DESIGN D...
- Publication number 20170206650
- Publication date Jul 20, 2017
- KLA-Tencor Corporation
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE BASED SPECIMEN PROCESS CONTROL
- Publication number 20170200264
- Publication date Jul 13, 2017
- KLA-Tencor Corporation
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPE BASED GROUPING
- Publication number 20170186151
- Publication date Jun 29, 2017
- KLA-Tencor Corporation
- Saibal Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REDUCING REGISTRATION AND DESIGN VICINITY INDUCED NOISE FOR INTRA-D...
- Publication number 20170161888
- Publication date Jun 8, 2017
- KLA-Tencor Corporation
- Saibal Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Outlier Detection on Pattern of Interest Image Populations
- Publication number 20160314578
- Publication date Oct 27, 2016
- KLA-Tencor Corporation
- Saibal Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Virtual Inspection Systems with Multiple Modes
- Publication number 20160025648
- Publication date Jan 28, 2016
- KLA-Tencor Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR THE AUTOMATIC DETERMINATION OF CRITICAL PARAM...
- Publication number 20140303912
- Publication date Oct 9, 2014
- KLA-Tencor Corporation
- Saibal Banerjee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Adaptive Sampling for Semiconductor Inspection Recipe Creation, Def...
- Publication number 20140301630
- Publication date Oct 9, 2014
- KLA-Tencor Corporation
- Ashok V. Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods, defect review tools, and systems for locating a defect in...
- Publication number 20080032429
- Publication date Feb 7, 2008
- Da Chen
- G06 - COMPUTING CALCULATING COUNTING

Saibal Banerjee

Person

Patents Grantslast 30 patents

System and method for generation of wafer inspection critical areas

Shape metric based scoring of wafer locations

System and method for generation of wafer inspection critical areas

Criticality analysis augmented process window qualification sampling

Virtual inspection systems with multiple modes

Image based specimen process control

Defect sensitivity of semiconductor wafer inspectors using design d...

Reducing registration and design vicinity induced noise for intra-d...

Shape based grouping

Virtual inspection systems with multiple modes

Outlier detection on pattern of interest image populations

Adaptive sampling for semiconductor inspection recipe creation, def...

Stream basis set division multiplexing

Multi-neighbor proportional forwarding in a network

Routing table for non-uniform random neighbor selection

Methods, defect review tools, and systems for locating a defect in...

Power assisted automatic supervised classifier creation tool for se...

Patents Applicationslast 30 patents

System and Method for Generation of Wafer Inspection Critical Areas

SHAPE METRIC BASED SCORING OF WAFER LOCATIONS

CRITICALITY ANALYSIS AUGMENTED PROCESS WINDOW QUALIFICATION SAMPLING

System and Method for Generation of Wafer Inspection Critical Areas

VIRTUAL INSPECTION SYSTEMS WITH MULTIPLE MODES

DEFECT SENSITIVITY OF SEMICONDUCTOR WAFER INSPECTORS USING DESIGN D...

IMAGE BASED SPECIMEN PROCESS CONTROL

SHAPE BASED GROUPING

REDUCING REGISTRATION AND DESIGN VICINITY INDUCED NOISE FOR INTRA-D...

Outlier Detection on Pattern of Interest Image Populations

Virtual Inspection Systems with Multiple Modes

SYSTEM AND METHOD FOR THE AUTOMATIC DETERMINATION OF CRITICAL PARAM...

Adaptive Sampling for Semiconductor Inspection Recipe Creation, Def...

Methods, defect review tools, and systems for locating a defect in...