Saibal MUKHOPADHYAY

Person

Atlanta, GA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Analyzing a patterning process using a model of yield
- Patent number 8,880,382
- Issue date Nov 4, 2014
- International Business Machines Corporation
- Saeed Bagheri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analyzing a patterning process using a model of yield
- Patent number 8,682,634
- Issue date Mar 25, 2014
- International Business Machines Corporation
- Saeed Bagheri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analyzing multiple induced systematic and statistical layout depend...
- Patent number 8,418,087
- Issue date Apr 9, 2013
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analyzing multiple induced systematic and statistical layout depend...
- Patent number 8,176,444
- Issue date May 8, 2012
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for characterizing device variation in electronic memory ci...
- Patent number 8,086,917
- Issue date Dec 27, 2011
- International Business Machines Corporation
- Ching-Te K. Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuits and methods for characterizing device variation in electro...
- Patent number 7,673,195
- Issue date Mar 2, 2010
- International Business Machines Corporation
- Ching-Te K. Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuits and design structures for monitoring NBTI (negative bias t...
- Patent number 7,642,864
- Issue date Jan 5, 2010
- International Business Machines Corporation
- Ching-Te K. Chuang
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
System and Methods for Solving Constraint Optimization Problems usi...
- Publication number 20240281662
- Publication date Aug 22, 2024
- Georgia Tech Research Corporation
- Daehyun Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analyzing A Patterning Process Using A Model Of Yield
- Publication number 20130185046
- Publication date Jul 18, 2013
- International Business Machines Corporation
- Saeed BAGHERI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYZING A PATTERNING PROCESS USING A MODEL OF YIELD
- Publication number 20130185045
- Publication date Jul 18, 2013
- International Business Machines Corporation
- Saeed BAGHERI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYZING MULTIPLE INDUCED SYSTEMATIC AND STATISTICAL LAYOUT DEPEND...
- Publication number 20120144356
- Publication date Jun 7, 2012
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Techniques for Pattern Process Tuning and Design Optimization for M...
- Publication number 20110173577
- Publication date Jul 14, 2011
- International Business Machines Corporation
- Ching-Te K. Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analyzing Multiple Induced Systematic and Statistical Layout Depend...
- Publication number 20100269079
- Publication date Oct 21, 2010
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR CHARACTERIZING DEVICE VARIATION IN ELECTRONIC MEMORY CI...
- Publication number 20090310430
- Publication date Dec 17, 2009
- International Business Machines Corporation
- Ching-Te K. Chuang
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUITS AND DESIGN STRUCTURES FOR MONITORING NBTI (NEGATIVE BIAS T...
- Publication number 20090189703
- Publication date Jul 30, 2009
- International Business Machines Corporation
- Ching-Te K. Chuang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUITS, METHODS AND DESIGN STRUCTURES FOR ADAPTIVE REPAIR OF SRAM...
- Publication number 20090190426
- Publication date Jul 30, 2009
- International Business Machines Corporation
- Ching-Te K. Chuang
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUITS AND METHODS FOR CHARACTERIZING DEVICE VARIATION IN ELECTRO...
- Publication number 20090091346
- Publication date Apr 9, 2009
- International Business Machines Corporation
- Ching-Te K. Chuang
- G11 - INFORMATION STORAGE

Saibal MUKHOPADHYAY

Person

Patents Grantslast 30 patents

Analyzing a patterning process using a model of yield

Analyzing a patterning process using a model of yield

Analyzing multiple induced systematic and statistical layout depend...

Analyzing multiple induced systematic and statistical layout depend...

Methods for characterizing device variation in electronic memory ci...

Circuits and methods for characterizing device variation in electro...

Circuits and design structures for monitoring NBTI (negative bias t...

Patents Applicationslast 30 patents

System and Methods for Solving Constraint Optimization Problems usi...

Analyzing A Patterning Process Using A Model Of Yield

ANALYZING A PATTERNING PROCESS USING A MODEL OF YIELD

ANALYZING MULTIPLE INDUCED SYSTEMATIC AND STATISTICAL LAYOUT DEPEND...

Techniques for Pattern Process Tuning and Design Optimization for M...

Analyzing Multiple Induced Systematic and Statistical Layout Depend...

METHODS FOR CHARACTERIZING DEVICE VARIATION IN ELECTRONIC MEMORY CI...

CIRCUITS AND DESIGN STRUCTURES FOR MONITORING NBTI (NEGATIVE BIAS T...

CIRCUITS, METHODS AND DESIGN STRUCTURES FOR ADAPTIVE REPAIR OF SRAM...

CIRCUITS AND METHODS FOR CHARACTERIZING DEVICE VARIATION IN ELECTRO...