Saibal Mukhopadhyay

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West Lafayette, IN, US

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Patents Grantslast 30 patents

Information Patent Grant
Self-repairing technique in nano-scale SRAM to reduce parametric fa...
- Patent number 7,508,697
- Issue date Mar 24, 2009
- Purdue Research Foundation
- Saibal Mukhopadhyay
- G11 - INFORMATION STORAGE
Information Patent Grant
Low power scan design and delay fault testing technique using first...
- Patent number 7,319,343
- Issue date Jan 15, 2008
- Purdue Research Foundation - Purdue University
- Swarup Bhunia
- G01 - MEASURING TESTING
Information Patent Grant
Sense amplifier circuit
- Patent number 7,304,903
- Issue date Dec 4, 2007
- Purdue Research Foundation
- Saibal Mukhopadhyay
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Sense amplifier circuit
- Publication number 20070171748
- Publication date Jul 26, 2007
- Saibal Mukhopadhyay
- G11 - INFORMATION STORAGE
Information Patent Application
Low power scan design and delay fault testing technique using first...
- Publication number 20060220679
- Publication date Oct 5, 2006
- Purdue Research Foundation-Purdue University
- Swarup Bhunia
- G01 - MEASURING TESTING