Sailendra Chadalavada

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Asynchronous in-system testing for autonomous systems and applications
- Patent number 12,291,219
- Issue date May 6, 2025
- NVIDIA Corporation
- Anitha Kalva
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Techniques for isolating interfaces while testing semiconductor dev...
- Patent number 11,867,744
- Issue date Jan 9, 2024
- NVIDIA Corporation
- Animesh Khare
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Performing testing utilizing staggered clocks
- Patent number 11,668,750
- Issue date Jun 6, 2023
- NVIDIA Corporation
- Sailendra Chadalavada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-chip execution of in-system test utilizing a generalized test image
- Patent number 10,890,620
- Issue date Jan 12, 2021
- NVIDIA Corp.
- Milind Bhaiyyasaheb Sonawane
- G01 - MEASURING TESTING
Information Patent Grant
Field adaptable in-system test mechanisms
- Patent number 10,746,798
- Issue date Aug 18, 2020
- NVIDIA Corp.
- Sailendra Chadalavada
- G01 - MEASURING TESTING
Information Patent Grant
Granular dynamic test systems and methods
- Patent number 10,545,189
- Issue date Jan 28, 2020
- NVIDIA Corporation
- Milind Sonawane
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
LOCALIZED IN-SYSTEM TESTING FOR AUTONOMOUS AND SEMI-AUTONOMOUS SYST...
- Publication number 20250222941
- Publication date Jul 10, 2025
- NVIDIA Corporation
- Anitha Kalva
- B60 - VEHICLES IN GENERAL
Information Patent Application
IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS
- Publication number 20250028620
- Publication date Jan 23, 2025
- NVIDIA Corporation
- Shantanu SARANGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ASYNCHRONOUS IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS
- Publication number 20240227824
- Publication date Jul 11, 2024
- NVIDIA Corporation
- Anitha Kalva
- B60 - VEHICLES IN GENERAL
Information Patent Application
ASYNCHRONOUS IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS
- Publication number 20240132083
- Publication date Apr 25, 2024
- NVIDIA Corporation
- Anitha Kalva
- B60 - VEHICLES IN GENERAL
Information Patent Application
TECHNIQUE FOR ENABLING ON-DIE NOISE MEASUREMENT DURING ATE TESTING...
- Publication number 20230146920
- Publication date May 11, 2023
- NVIDIA Corporation
- Bonita Bhaskaran
- G01 - MEASURING TESTING
Information Patent Application
PERFORMING TESTING UTILIZING STAGGERED CLOCKS
- Publication number 20230089800
- Publication date Mar 23, 2023
- NVIDIA Corporation
- Sailendra Chadalavada
- G01 - MEASURING TESTING
Information Patent Application
RUNTIME IN-SYSTEM TESTING
- Publication number 20220365857
- Publication date Nov 17, 2022
- NVIDIA Corporation
- Sailendra Chadalavada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUES FOR ISOLATING INTERFACES WHILE TESTING SEMICONDUCTOR DEV...
- Publication number 20220120804
- Publication date Apr 21, 2022
- NVIDIA Corporation
- Animesh KHARE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-CHIP EXECUTION OF IN-SYSTEM TEST UTILIZING A GENERALIZED TEST IMAGE
- Publication number 20200363470
- Publication date Nov 19, 2020
- NVIDIA Corp.
- Milind Bhaiyyasaheb Sonawane
- G01 - MEASURING TESTING

Sailendra Chadalavada

Person

Patents Grantslast 30 patents

Asynchronous in-system testing for autonomous systems and applications

Techniques for isolating interfaces while testing semiconductor dev...

Performing testing utilizing staggered clocks

On-chip execution of in-system test utilizing a generalized test image

Field adaptable in-system test mechanisms

Granular dynamic test systems and methods

Patents Applicationslast 30 patents

LOCALIZED IN-SYSTEM TESTING FOR AUTONOMOUS AND SEMI-AUTONOMOUS SYST...

IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS

ASYNCHRONOUS IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS

ASYNCHRONOUS IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS

TECHNIQUE FOR ENABLING ON-DIE NOISE MEASUREMENT DURING ATE TESTING...

PERFORMING TESTING UTILIZING STAGGERED CLOCKS

RUNTIME IN-SYSTEM TESTING

TECHNIQUES FOR ISOLATING INTERFACES WHILE TESTING SEMICONDUCTOR DEV...

ON-CHIP EXECUTION OF IN-SYSTEM TEST UTILIZING A GENERALIZED TEST IMAGE