Sairam Ravu

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Chennai, IN

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Patents Grantslast 30 patents

Information Patent Grant
System and method for determining defects using physics-based image...
- Patent number 11,676,264
- Issue date Jun 13, 2023
- KLA Corporation
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for inspection of semiconductor structures with...
- Patent number 11,379,967
- Issue date Jul 5, 2022
- KLA Corporation
- Jacob George
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diagnostic methods for the classifiers and the defects captured by...
- Patent number 11,237,119
- Issue date Feb 1, 2022
- KLA-Tencor Corporation
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimizing training sets used for setting up inspection-related alg...
- Patent number 10,267,748
- Issue date Apr 23, 2019
- KLA-Tencor Corp.
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Determining Defects Using Physics-Based Image...
- Publication number 20210027445
- Publication date Jan 28, 2021
- KLA Corporation
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods And Systems For Inspection Of Semiconductor Structures With...
- Publication number 20200234428
- Publication date Jul 23, 2020
- KLA Corporation
- Jacob George
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Diagnostic Methods for the Classifiers and the Defects Captured by...
- Publication number 20180197714
- Publication date Jul 12, 2018
- KLA-Tencor Corporation
- Martin Plihal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optimizing Training Sets Used for Setting Up Inspection-Related Alg...
- Publication number 20180106732
- Publication date Apr 19, 2018
- KLA-Tencor Corporation
- Martin Plihal
- G01 - MEASURING TESTING