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Sakae Kobori

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  • Shirosato, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Scanning electron microscope
    • Patent number 8,921,784
    • Issue date Dec 30, 2014
    • Hitachi High-Technologies Corporation
    • Toru Iwaya
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE
    • Publication number 20120211654
    • Publication date Aug 23, 2012
    • Hitachi High-Technologies Corporation
    • Toru Iwaya
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Ion Milling system and ion milling method
    • Publication number 20080202920
    • Publication date Aug 28, 2008
    • Hitachi High-Technologies Corporation
    • Toru Iwaya
    • G01 - MEASURING TESTING