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Sakae Sugiyama
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Hitachi, JP
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last 30 patents
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Patent Grant
Method and apparatus for master-slave manipulation supplemented by...
Patent number
4,837,734
Issue date
Jun 6, 1989
Hitachi, Ltd.
Yoshiaki Ichikawa
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method of an apparatus for determining working original point for m...
Patent number
4,811,248
Issue date
Mar 7, 1989
Hitachi, Ltd.
Makoto Senoh
G05 - CONTROLLING REGULATING
Information
Patent Grant
Flaw size measurement equipment using eddy currents
Patent number
4,739,261
Issue date
Apr 19, 1988
Hitachi, Ltd.
Sakae Sugiyama
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Trackless scanner
Patent number
4,655,085
Issue date
Apr 7, 1987
Hitachi, Ltd.
Fumio Tomizawa
G01 - MEASURING TESTING
Information
Patent Grant
Method of selecting composite reception signal in ultrasonic inspec...
Patent number
4,592,237
Issue date
Jun 3, 1986
Hitachi, Ltd.
Satoshi Ogura
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting a leakage of fluid
Patent number
4,543,817
Issue date
Oct 1, 1985
Hitachi, Ltd.
Sakae Sugiyama
F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information
Patent Grant
Ultrasonic method of determining nature of flaws by incremental sca...
Patent number
4,475,394
Issue date
Oct 9, 1984
Hitachi, Ltd.
Hiroyuki Takeda
G01 - MEASURING TESTING
Information
Patent Grant
Non-destructive inspection by frequency spectrum resolution
Patent number
4,428,235
Issue date
Jan 31, 1984
Hitachi, Ltd.
Sakae Sugiyama
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic probing apparatus
Patent number
4,331,034
Issue date
May 25, 1982
The Chugoku Electric Power Co., Inc.
Hiroyuki Takeda
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic flaw detector driving apparatus
Patent number
4,279,158
Issue date
Jul 21, 1981
Hitachi, Ltd.
Sigeru Kajiyama
G01 - MEASURING TESTING
Information
Patent Grant
Control system for boiling-water reactor
Patent number
4,108,720
Issue date
Aug 22, 1978
Hitachi, Ltd.
Takao Sato
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING