Sakon Murayama

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Kariya-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Analysis system
- Patent number 10,605,701
- Issue date Mar 31, 2020
- JTEKT Corporation
- Toshiyuki Tsuzuki
- G05 - CONTROLLING REGULATING
Information Patent Grant
Abnormality analysis system and analysis apparatus
- Patent number 10,474,128
- Issue date Nov 12, 2019
- JTEKT Corporation
- Toshiyuki Tsuzuki
- G05 - CONTROLLING REGULATING
Information Patent Grant
Optical detection device and facility management system
- Patent number 10,354,522
- Issue date Jul 16, 2019
- JTEKT Corporation
- Tomoyuki Nakagawa
- G08 - SIGNALLING

Patents Applicationslast 30 patents

Information Patent Application
MACHINERY MANAGEMENT SYSTEM
- Publication number 20200326690
- Publication date Oct 15, 2020
- JTEKT Corporation
- Tomonari OGI
- G05 - CONTROLLING REGULATING
Information Patent Application
FACILITY MANAGEMENT SYSTEM
- Publication number 20200326688
- Publication date Oct 15, 2020
- JTEKT Corporation
- Tomonari OGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL DETECTION DEVICE AND FACILITY MANAGEMENT SYSTEM
- Publication number 20180165955
- Publication date Jun 14, 2018
- JTEKT Corporation
- Tomoyuki NAKAGAWA
- G05 - CONTROLLING REGULATING
Information Patent Application
ANALYSIS SYSTEM
- Publication number 20180045613
- Publication date Feb 15, 2018
- JTEKT Corporation
- Toshiyuki TSUZUKI
- G01 - MEASURING TESTING
Information Patent Application
ABNORMALITY ANALYSIS SYSTEM AND ANALYSIS APPARATUS
- Publication number 20170139398
- Publication date May 18, 2017
- JTEKT Corporation
- Toshiyuki TSUZUKI
- G05 - CONTROLLING REGULATING