Sally Liu

Person

Hsin-Chu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Noise decoupling structure with through-substrate vias
- Patent number 9,425,154
- Issue date Aug 23, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3-D inductor and transformer
- Patent number 9,373,673
- Issue date Jun 21, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiao-Tsung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3-D inductor and transformer
- Patent number 9,059,026
- Issue date Jun 16, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiao-Tsung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Noise decoupling structure with through-substrate vias
- Patent number 8,928,127
- Issue date Jan 6, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for substrate noise analysis
- Patent number 8,627,253
- Issue date Jan 7, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tzu-Jin Yeh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Gated-varactors
- Patent number 8,609,479
- Issue date Dec 17, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Four-terminal metal-over-metal capacitor design kit
- Patent number 8,558,228
- Issue date Oct 15, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Through-substrate via waveguides
- Patent number 8,502,338
- Issue date Aug 6, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiao-Tsung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Balun system and method
- Patent number 8,502,620
- Issue date Aug 6, 2013
- Taiwan Semiconductor Maufacturing Company, Ltd.
- Jhe-Ching Lu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
3D inductor and transformer
- Patent number 8,471,358
- Issue date Jun 25, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiao-Tsung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate controlled bipolar junction transistor on fin-like field effec...
- Patent number 8,373,229
- Issue date Feb 12, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuits and methods of forming the same
- Patent number 8,362,591
- Issue date Jan 29, 2013
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsiao-Tsung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus of deembedding
- Patent number 8,350,586
- Issue date Jan 8, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shu-Ying Cho
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for radio frequency amplifier
- Patent number 8,324,970
- Issue date Dec 4, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chewn-Pu Jou
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Unified model for process variations in integrated circuits
- Patent number 8,275,584
- Issue date Sep 25, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Kai Lin
- G01 - MEASURING TESTING
Information Patent Grant
Gated-varactors
- Patent number 8,273,616
- Issue date Sep 25, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmitting radio frequency signal in semiconductor structure
- Patent number 8,193,880
- Issue date Jun 5, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shu-Ying Cho
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Four-terminal gate-controlled LVBJTs
- Patent number 8,115,280
- Issue date Feb 14, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accurate capacitance measurement for ultra large scale integrated c...
- Patent number 8,115,500
- Issue date Feb 14, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yih-Yuh Doong
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for de-embedding on-wafer devices
- Patent number 7,954,080
- Issue date May 31, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiao-Tsung Yen
- G01 - MEASURING TESTING
Information Patent Grant
Accurate capacitance measurement for ultra large scale integrated c...
- Patent number 7,880,494
- Issue date Feb 1, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yih-Yuh Doong
- G01 - MEASURING TESTING
Information Patent Grant
Accurate capacitance measurement for ultra large scale integrated c...
- Patent number 7,772,868
- Issue date Aug 10, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yih-Yuh Doong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
3-D Inductor and Transformer
- Publication number 20150255531
- Publication date Sep 10, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiao-Tsung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Noise Decoupling Structure with Through-Substrate Vias
- Publication number 20150104925
- Publication date Apr 16, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3D Inductor and Transformer
- Publication number 20140374875
- Publication date Dec 25, 2014
- Hsiao-Tsung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATED-VARACTORS
- Publication number 20120319176
- Publication date Dec 20, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Balun System and Method
- Publication number 20120119845
- Publication date May 17, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jhe-Ching Lu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Four-Terminal Metal-Over-Metal Capacitor Design Kit
- Publication number 20120104387
- Publication date May 3, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Noise Decoupling Structure with Through-Substrate Vias
- Publication number 20120074515
- Publication date Mar 29, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Through-Substrate Via Waveguides
- Publication number 20120061795
- Publication date Mar 15, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiao-Tsung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE CONTROLLED BIPOLAR JUNCTION TRANSISTOR ON FIN-LIKE FIELD EFFEC...
- Publication number 20120049282
- Publication date Mar 1, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUITS AND METHODS OF FORMING THE SAME
- Publication number 20110298551
- Publication date Dec 8, 2011
- Taiwan Semiconductor Manufacturing Co., LTD
- Hsiao-Tsung YEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3D Inductor and Transformer
- Publication number 20110291232
- Publication date Dec 1, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiao-Tsung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Substrate Noise Analysis
- Publication number 20110265051
- Publication date Oct 27, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tzu-Jin Yeh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GATED-VARACTORS
- Publication number 20110204969
- Publication date Aug 25, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Accurate Capacitance Measurement for Ultra Large Scale Integrated C...
- Publication number 20110168995
- Publication date Jul 14, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yih-Yuh Doong
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT AND METHOD FOR RADIO FREQUENCY AMPLIFIER
- Publication number 20110090012
- Publication date Apr 21, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chewn-Pu JOU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS OF DEEMBEDDING
- Publication number 20110001504
- Publication date Jan 6, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shu-Ying Cho
- G01 - MEASURING TESTING
Information Patent Application
Four-Terminal Gate-Controlled LVBJTs
- Publication number 20100219504
- Publication date Sep 2, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Accurate Capacitance Measurement for Ultra Large Scale Integrated C...
- Publication number 20100156453
- Publication date Jun 24, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yih-Yuh Doong
- G01 - MEASURING TESTING
Information Patent Application
DE-Embedding Method For On-Wafer Devices
- Publication number 20090224791
- Publication date Sep 10, 2009
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiao-Tsung Yen
- G01 - MEASURING TESTING
Information Patent Application
TRANSMITTING RADIO FREQUENCY SIGNAL IN SEMICONDUCTOR STRUCTURE
- Publication number 20090195327
- Publication date Aug 6, 2009
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shu-Ying Cho
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Accurate Capacitance Measurement for Ultra Large Scale Integrated C...
- Publication number 20090002012
- Publication date Jan 1, 2009
- Yih-Yuh Doong
- G01 - MEASURING TESTING
Information Patent Application
Unified Model for process variations in integrated circuits
- Publication number 20080140363
- Publication date Jun 12, 2008
- Chung-Kai Lin
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Noise decoupling structure with through-substrate vias

3-D inductor and transformer

3-D inductor and transformer

Noise decoupling structure with through-substrate vias

Method for substrate noise analysis

Gated-varactors

Four-terminal metal-over-metal capacitor design kit

Through-substrate via waveguides

Balun system and method

3D inductor and transformer

Gate controlled bipolar junction transistor on fin-like field effec...

Integrated circuits and methods of forming the same

Method and apparatus of deembedding

Circuit and method for radio frequency amplifier

Unified model for process variations in integrated circuits

Gated-varactors

Transmitting radio frequency signal in semiconductor structure

Four-terminal gate-controlled LVBJTs

Accurate capacitance measurement for ultra large scale integrated c...

Method and apparatus for de-embedding on-wafer devices

Accurate capacitance measurement for ultra large scale integrated c...

Accurate capacitance measurement for ultra large scale integrated c...

Patents Applicationslast 30 patents

3-D Inductor and Transformer

Noise Decoupling Structure with Through-Substrate Vias

3D Inductor and Transformer

GATED-VARACTORS

Balun System and Method

Four-Terminal Metal-Over-Metal Capacitor Design Kit

Noise Decoupling Structure with Through-Substrate Vias

Through-Substrate Via Waveguides

GATE CONTROLLED BIPOLAR JUNCTION TRANSISTOR ON FIN-LIKE FIELD EFFEC...

INTEGRATED CIRCUITS AND METHODS OF FORMING THE SAME

3D Inductor and Transformer

Method for Substrate Noise Analysis

GATED-VARACTORS

Accurate Capacitance Measurement for Ultra Large Scale Integrated C...

CIRCUIT AND METHOD FOR RADIO FREQUENCY AMPLIFIER

METHOD AND APPARATUS OF DEEMBEDDING

Four-Terminal Gate-Controlled LVBJTs

Accurate Capacitance Measurement for Ultra Large Scale Integrated C...

DE-Embedding Method For On-Wafer Devices

TRANSMITTING RADIO FREQUENCY SIGNAL IN SEMICONDUCTOR STRUCTURE

Accurate Capacitance Measurement for Ultra Large Scale Integrated C...

Unified Model for process variations in integrated circuits