Sam H. Allen Jr.

Person

New Braunfels, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Broadband distribution of SECS-II data
- Patent number 6,826,439
- Issue date Nov 30, 2004
- Advanced Micro Devices, Inc.
- Casey A. Barber
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Determining a possible cause of a fault in a semiconductor fabricat...
- Patent number 6,790,680
- Issue date Sep 14, 2004
- Advanced Micro Devices, Inc.
- Jason A. Grover
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of dynamically enabling additional sensors based upon initia...
- Patent number 6,792,389
- Issue date Sep 14, 2004
- Advanced Micro Devices, Inc.
- Sam H. Allen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Predictive processing method in a semiconductor processing facility
- Patent number 6,766,285
- Issue date Jul 20, 2004
- Advanced Micro Devices, Inc.
- Sam H. Allen
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for proactive dispatch system to improve line...
- Patent number 6,763,277
- Issue date Jul 13, 2004
- Advanced Micro Devices, Inc.
- Sam H. Allen
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Operating a processing tool in a degraded mode upon detecting a fault
- Patent number 6,763,278
- Issue date Jul 13, 2004
- Advanced Micro Devices, Inc.
- Elfido Coss
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for determining wafer identity and orientation
- Patent number 6,666,337
- Issue date Dec 23, 2003
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer rotation randomization in cluster tool processing
- Patent number 6,662,070
- Issue date Dec 9, 2003
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining, tracking and/or controlling processing base...
- Patent number 6,638,778
- Issue date Oct 28, 2003
- Advanced Micro Devices, Inc.
- Anastasia Oshelski Peterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer rotation randomization for process defect detection in semico...
- Patent number 6,625,556
- Issue date Sep 23, 2003
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer rotation in semiconductor processing
- Patent number 6,622,111
- Issue date Sep 16, 2003
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for aligning wafers
- Patent number 6,440,821
- Issue date Aug 27, 2002
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Universal multi-tool adapter for reconfiguring a wafer processing line
- Patent number 6,427,095
- Issue date Jul 30, 2002
- Advanced Micro Devices, Inc.
- Sam H. Allen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for sorting multiple semiconductor wafers
- Patent number 6,213,708
- Issue date Apr 10, 2001
- Advanced Micro Devices, Inc.
- Sam H. Allen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
System for brokering fault detection data
- Publication number 20030171885
- Publication date Sep 11, 2003
- Elfido Coss
- G05 - CONTROLLING REGULATING

Sam H. Allen Jr.

Person

Patents Grantslast 30 patents

Broadband distribution of SECS-II data

Determining a possible cause of a fault in a semiconductor fabricat...

Method of dynamically enabling additional sensors based upon initia...

Predictive processing method in a semiconductor processing facility

Method and apparatus for proactive dispatch system to improve line...

Operating a processing tool in a degraded mode upon detecting a fault

Method and apparatus for determining wafer identity and orientation

Wafer rotation randomization in cluster tool processing

Method for determining, tracking and/or controlling processing base...

Wafer rotation randomization for process defect detection in semico...

Wafer rotation in semiconductor processing

Method and apparatus for aligning wafers

Universal multi-tool adapter for reconfiguring a wafer processing line

System for sorting multiple semiconductor wafers

Patents Applicationslast 30 patents

System for brokering fault detection data