Saman M. I. Adham

Person

Kanata, CA

People

Patents Grantslast 30 patents

Information Patent Grant
PUF method and structure
- Patent number 12,184,795
- Issue date Dec 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shih-Lien Linus Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for conducting built-in self-test of memory macro
- Patent number 12,033,710
- Issue date Jul 9, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ted Wong
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan architecture for interconnect testing in 3D integrated circuits
- Patent number 11,899,064
- Issue date Feb 13, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Grant
Physical unclonable function (PUF) security key generation
- Patent number 11,856,115
- Issue date Dec 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Saman M. I. Adham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Conducting built-in self-test of memory macro
- Patent number 11,823,758
- Issue date Nov 21, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Saman Adham
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan synchronous-write-through testing architectures for a memory d...
- Patent number 11,734,142
- Issue date Aug 22, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ming-Hung Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan architecture for interconnect testing in 3D integrated circuits
- Patent number 11,549,984
- Issue date Jan 10, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Grant
Memory address protection circuit and method
- Patent number 11,379,298
- Issue date Jul 5, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Saman M. I. Adham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan synchronous-write-through testing architectures for a memory d...
- Patent number 11,256,588
- Issue date Feb 22, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ming-Hung Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inter-hamming difference analyzer for memory array and measuring an...
- Patent number 11,210,165
- Issue date Dec 28, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shih-Lien Linus Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory array and measuring and testing methods for inter-hamming di...
- Patent number 10,838,809
- Issue date Nov 17, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Lien Linus Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory address protection circuit and method
- Patent number 10,740,174
- Issue date Aug 11, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Saman M. I. Adham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan synchronous-write-through testing architectures for a memory d...
- Patent number 10,705,934
- Issue date Jul 7, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ming-Hung Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan architecture for interconnect testing in 3D integrated circuits
- Patent number 10,539,617
- Issue date Jan 21, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Grant
Hamming-distance analyzer
- Patent number 10,515,710
- Issue date Dec 24, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Lien Linus Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
On-line self-checking hamming encoder, decoder and associated method
- Patent number 10,382,060
- Issue date Aug 13, 2019
- Taiwan Semiconductor Manufacturing Company Ltd.
- Ramin Yazdi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Memory array and measuring and testing methods for inter-hamming di...
- Patent number 10,372,532
- Issue date Aug 6, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Lien Linus Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, device and computer program product for circuit testing
- Patent number 9,835,680
- Issue date Dec 5, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Grant
Fault injection of finFET devices
- Patent number 9,367,662
- Issue date Jun 14, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Atul Katoch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for interconnect test
- Patent number 9,341,672
- Issue date May 17, 2016
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sandeep Kumar Goel
- G11 - INFORMATION STORAGE
Information Patent Grant
Mechanisms for built-in self test and repair for memory devices
- Patent number 9,269,459
- Issue date Feb 23, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Saman M. I. Adham
- G11 - INFORMATION STORAGE
Information Patent Grant
Fault injection of finFET devices
- Patent number 8,959,468
- Issue date Feb 17, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Atul Katoch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mechanisms for built-in self test and repair for memory devices
- Patent number 8,942,051
- Issue date Jan 27, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Saman Adham
- G11 - INFORMATION STORAGE
Information Patent Grant
Mechanisms for built-in self repair of memory devices using failed...
- Patent number 8,873,318
- Issue date Oct 28, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Volodymyr Shvydun
- G11 - INFORMATION STORAGE
Information Patent Grant
Mechanisms for built-in self repair of memory devices using failed...
- Patent number 8,760,949
- Issue date Jun 24, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Volodymyr Shvydun
- G11 - INFORMATION STORAGE
Information Patent Grant
Mechanisms for built-in self test and repair for memory devices
- Patent number 8,605,527
- Issue date Dec 10, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Volodymyr Shvydun
- G11 - INFORMATION STORAGE
Information Patent Grant
Mechanisms for built-in self repair of memory devices using failed...
- Patent number 8,509,014
- Issue date Aug 13, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Volodymyr Shvydun
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory repair circuit and method
- Patent number 7,257,733
- Issue date Aug 14, 2007
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and test circuit for testing memory internal write enable
- Patent number 7,139,946
- Issue date Nov 21, 2006
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G11 - INFORMATION STORAGE
Information Patent Grant
Self-testable digital signal processor and method for self-testing...
- Patent number 5,668,817
- Issue date Sep 16, 1997
- Northern Telecom Limited
- Saman M. I. Adham
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR CONDUCTING BUILT-IN SELF-TEST OF MEMORY MACRO
- Publication number 20240321377
- Publication date Sep 26, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ted Wong
- G11 - INFORMATION STORAGE
Information Patent Application
SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS
- Publication number 20240133951
- Publication date Apr 25, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Sandeep Kumar GOEL
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL UNCLONABLE FUNCTION (PUF) SECURITY KEY GENERATION
- Publication number 20240089127
- Publication date Mar 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Saman M.I. Adham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONDUCTING BUILT-IN SELF-TEST OF MEMORY MACRO
- Publication number 20240055066
- Publication date Feb 15, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ted Wong
- G11 - INFORMATION STORAGE
Information Patent Application
SCAN SYNCHRONOUS-WRITE-THROUGH TESTING ARCHITECTURES FOR A MEMORY D...
- Publication number 20230342272
- Publication date Oct 26, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ming-Hung CHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Compute-In-Memory-Based Floating-Point Processor
- Publication number 20230133360
- Publication date May 4, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Rawan Naous
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS
- Publication number 20230113905
- Publication date Apr 13, 2023
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Sandeep Kumar GOEL
- G01 - MEASURING TESTING
Information Patent Application
CONDUCTING BUILT-IN SELF-TEST OF MEMORY MACRO
- Publication number 20220254428
- Publication date Aug 11, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Saman Adham
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR CONDUCTING BUILT-IN SELF-TEST OF MEMORY MACRO
- Publication number 20220254429
- Publication date Aug 11, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ted Wong
- G11 - INFORMATION STORAGE
Information Patent Application
SCAN SYNCHRONOUS-WRITE-THROUGH TESTING ARCHITECTURES FOR A MEMORY D...
- Publication number 20220171688
- Publication date Jun 2, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ming-Hung CHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PUF METHOD AND STRUCTURE
- Publication number 20210409233
- Publication date Dec 30, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- Shih-Lien Linus Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHYSICAL UNCLONABLE FUNCTION (PUF) SECURITY KEY GENERATION
- Publication number 20210218583
- Publication date Jul 15, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Saman M.I. Adham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTER-HAMMING DIFFERENCE ANALYZER FOR MEMORY ARRAY AND MEASURING AN...
- Publication number 20210042187
- Publication date Feb 11, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Lien Linus LU
- G01 - MEASURING TESTING
Information Patent Application
MEMORY ADDRESS PROTECTION CIRCUIT AND METHOD
- Publication number 20200371865
- Publication date Nov 26, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Saman M. I. ADHAM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN SYNCHRONOUS-WRITE-THROUGH TESTING ARCHITECTURES FOR A MEMORY D...
- Publication number 20200293417
- Publication date Sep 17, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ming-Hung CHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS
- Publication number 20200124668
- Publication date Apr 23, 2020
- Sandeep Kumar GOEL
- G01 - MEASURING TESTING
Information Patent Application
MEMORY ARRAY AND MEASURING AND TESTING METHODS FOR INTER-HAMMING DI...
- Publication number 20190294498
- Publication date Sep 26, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Lien Linus LU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN SYNCHRONOUS-WRITE-THROUGH TESTING ARCHITECTURES FOR A MEMORY D...
- Publication number 20190004915
- Publication date Jan 3, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ming-Hung CHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HAMMING-DISTANCE ANALYZER AND METHOD FOR ANALYZING HAMMING-DISTANCE
- Publication number 20180301204
- Publication date Oct 18, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Lien Linus Lu
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY ARRAY AND MEASURING AND TESTING METHODS FOR INTER-HAMMING DI...
- Publication number 20180157555
- Publication date Jun 7, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Lien Linus LU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HAMMING-DISTANCE ANALYZER
- Publication number 20180151245
- Publication date May 31, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Lien Linus Lu
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY ADDRESS PROTECTION CIRCUIT AND METHOD
- Publication number 20180150352
- Publication date May 31, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Saman M. I. ADHAM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-LINE SELF-CHECKING HAMMING ENCODER, DECODER AND ASSOCIATED METHOD
- Publication number 20180041229
- Publication date Feb 8, 2018
- RAMIN YAZDI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS
- Publication number 20170350939
- Publication date Dec 7, 2017
- Taiwan Semiconductor Manufacturing Co., LTD
- Sandeep Kumar GOEL
- G01 - MEASURING TESTING
Information Patent Application
METHOD, DEVICE AND COMPUTER PROGRAM PRODUCT FOR CIRCUIT TESTING
- Publication number 20160274178
- Publication date Sep 22, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sandeep Kumar GOEL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INTERCONNECT TEST
- Publication number 20160259006
- Publication date Sep 8, 2016
- Taiwan Semiconductor Manufacturing Co., LTD
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Application
FAULT INJECTION OF FINFET DEVICES
- Publication number 20150143315
- Publication date May 21, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Atul KATOCH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MECHANISMS FOR BUILT-IN SELF TEST AND REPAIR FOR MEMORY DEVICES
- Publication number 20150109848
- Publication date Apr 23, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Saman M. I. ADHAM
- G11 - INFORMATION STORAGE
Information Patent Application
FAULT INJECTION OF FINFET DEVICES
- Publication number 20140282332
- Publication date Sep 18, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Atul KATOCH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR INTERCONNECT TEST
- Publication number 20140281773
- Publication date Sep 18, 2014
- Taiwan Semiconductor Manufacturing Co., LTD
- Sandeep Kumar Goel
- G01 - MEASURING TESTING

Saman M. I. Adham

Person

Patents Grantslast 30 patents

PUF method and structure

System and method for conducting built-in self-test of memory macro

Scan architecture for interconnect testing in 3D integrated circuits

Physical unclonable function (PUF) security key generation

Conducting built-in self-test of memory macro

Scan synchronous-write-through testing architectures for a memory d...

Scan architecture for interconnect testing in 3D integrated circuits

Memory address protection circuit and method

Scan synchronous-write-through testing architectures for a memory d...

Inter-hamming difference analyzer for memory array and measuring an...

Memory array and measuring and testing methods for inter-hamming di...

Memory address protection circuit and method

Scan synchronous-write-through testing architectures for a memory d...

Scan architecture for interconnect testing in 3D integrated circuits

Hamming-distance analyzer

On-line self-checking hamming encoder, decoder and associated method

Memory array and measuring and testing methods for inter-hamming di...

Method, device and computer program product for circuit testing

Fault injection of finFET devices

Method and apparatus for interconnect test

Mechanisms for built-in self test and repair for memory devices

Fault injection of finFET devices

Mechanisms for built-in self test and repair for memory devices

Mechanisms for built-in self repair of memory devices using failed...

Mechanisms for built-in self repair of memory devices using failed...

Mechanisms for built-in self test and repair for memory devices

Mechanisms for built-in self repair of memory devices using failed...

Memory repair circuit and method

Method and test circuit for testing memory internal write enable

Self-testable digital signal processor and method for self-testing...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR CONDUCTING BUILT-IN SELF-TEST OF MEMORY MACRO

SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS

PHYSICAL UNCLONABLE FUNCTION (PUF) SECURITY KEY GENERATION

CONDUCTING BUILT-IN SELF-TEST OF MEMORY MACRO

SCAN SYNCHRONOUS-WRITE-THROUGH TESTING ARCHITECTURES FOR A MEMORY D...

Compute-In-Memory-Based Floating-Point Processor

SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS

CONDUCTING BUILT-IN SELF-TEST OF MEMORY MACRO

SYSTEM AND METHOD FOR CONDUCTING BUILT-IN SELF-TEST OF MEMORY MACRO

SCAN SYNCHRONOUS-WRITE-THROUGH TESTING ARCHITECTURES FOR A MEMORY D...

PUF METHOD AND STRUCTURE

PHYSICAL UNCLONABLE FUNCTION (PUF) SECURITY KEY GENERATION

INTER-HAMMING DIFFERENCE ANALYZER FOR MEMORY ARRAY AND MEASURING AN...

MEMORY ADDRESS PROTECTION CIRCUIT AND METHOD

SCAN SYNCHRONOUS-WRITE-THROUGH TESTING ARCHITECTURES FOR A MEMORY D...

SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS

MEMORY ARRAY AND MEASURING AND TESTING METHODS FOR INTER-HAMMING DI...

SCAN SYNCHRONOUS-WRITE-THROUGH TESTING ARCHITECTURES FOR A MEMORY D...

HAMMING-DISTANCE ANALYZER AND METHOD FOR ANALYZING HAMMING-DISTANCE

MEMORY ARRAY AND MEASURING AND TESTING METHODS FOR INTER-HAMMING DI...

HAMMING-DISTANCE ANALYZER

MEMORY ADDRESS PROTECTION CIRCUIT AND METHOD

ON-LINE SELF-CHECKING HAMMING ENCODER, DECODER AND ASSOCIATED METHOD

SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS

METHOD, DEVICE AND COMPUTER PROGRAM PRODUCT FOR CIRCUIT TESTING

METHOD AND APPARATUS FOR INTERCONNECT TEST

FAULT INJECTION OF FINFET DEVICES

MECHANISMS FOR BUILT-IN SELF TEST AND REPAIR FOR MEMORY DEVICES

FAULT INJECTION OF FINFET DEVICES

METHOD AND APPARATUS FOR INTERCONNECT TEST