Samantha D. DiStefano

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Burlington, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Centering substrates on a chuck
- Patent number 10,224,225
- Issue date Mar 5, 2019
- International Business Machines Corporation
- Shawn A. Adderly
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Waveguide structures used in phonotics chip packaging
- Patent number 10,078,183
- Issue date Sep 18, 2018
- GLOBALFOUNDRIES Inc.
- Shawn A. Adderly
- G02 - OPTICS
Information Patent Grant
Centering substrates on a chuck
- Patent number 9,997,385
- Issue date Jun 12, 2018
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for centering substrates on a chuck
- Patent number 9,685,362
- Issue date Jun 20, 2017
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Void monitoring device for measurement of wafer temperature variations
- Patent number 9,543,219
- Issue date Jan 10, 2017
- GLOBALFOUNDRIES Inc.
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting foreign material on a chuck
- Patent number 9,508,578
- Issue date Nov 29, 2016
- GLOBALFOUNDRIES Inc.
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CENTERING SUBSTRATES ON A CHUCK
- Publication number 20180240694
- Publication date Aug 23, 2018
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CENTERING SUBSTRATES ON A CHUCK
- Publication number 20170221742
- Publication date Aug 3, 2017
- International Business Machines Corporation
- Shawn A. Adderly
- G01 - MEASURING TESTING
Information Patent Application
WAVEGUIDE STRUCTURES
- Publication number 20170168242
- Publication date Jun 15, 2017
- GLOBALFOUNDRIES INC.
- Shawn A. Adderly
- G02 - OPTICS
Information Patent Application
VOID MONITORING DEVICE FOR MEASUREMENT OF WAFER TEMPERATURE VARIATIONS
- Publication number 20160155675
- Publication date Jun 2, 2016
- International Business Machines Corporation
- Shawn A. Adderly
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Centering Substrates on a Chuck
- Publication number 20150235881
- Publication date Aug 20, 2015
- International Business Machines Corporation
- Shawn A. Adderly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DETECTING FOREIGN MATERIAL ON A CHUCK
- Publication number 20150219479
- Publication date Aug 6, 2015
- International Business Machines Corporation
- Shawn A. Adderly
- G01 - MEASURING TESTING