SAMEE UR-REHMAN

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method of measuring, device manufacturing method, metrology apparat...
- Patent number 10,656,534
- Issue date May 19, 2020
- ASML Netherlands B.V.
- Nitesh Pandey
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MEASURING, DEVICE MANUFACTURING METHOD, METROLOGY APPARAT...
- Publication number 20180299794
- Publication date Oct 18, 2018
- ASML NETHERLANDS B.V.
- Nitesh PANDEY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METROLOGY METHOD, APPARATUS AND COMPUTER PROGRAM
- Publication number 20180216930
- Publication date Aug 2, 2018
- ASML NETHERLANDS B.V.
- SAMEE UR-REHMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY