Samee Ur Rehman

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method of determining information about a patterning process, metho...
- Patent number 11,604,419
- Issue date Mar 14, 2023
- ASML Netherlands B.V.
- Joannes Jitse Venselaar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of determining information about a patterning process, metho...
- Patent number 11,022,897
- Issue date Jun 1, 2021
- ASML Netherlands B.V.
- Joannes Jitse Venselaar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of determining a value of a parameter of interest of a targe...
- Patent number 10,585,048
- Issue date Mar 10, 2020
- ASML Netherlands B.V.
- Samee Ur Rehman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of optimizing a metrology process
- Patent number 10,585,354
- Issue date Mar 10, 2020
- ASML Netherlands B.V.
- Anagnostis Tsiatmas
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology method, apparatus and computer program
- Patent number 10,551,172
- Issue date Feb 4, 2020
- ASML Netherlands B.V.
- Samee Ur Rehman
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring, device manufacturing method, metrology apparat...
- Patent number 10,310,389
- Issue date Jun 4, 2019
- ASML Netherlands B.V.
- Nitesh Pandey
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR METROLOGY OPTIMIZATION
- Publication number 20220082944
- Publication date Mar 17, 2022
- ASML NETHERLANDS B.V.
- Samee Ur REHMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DETERMINING INFORMATION ABOUT A PATTERNING PROCESS, METHO...
- Publication number 20210255552
- Publication date Aug 19, 2021
- ASML NETHERLANDS B.V.
- Joannes Jitse VENSELAAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DETERMINING A VALUE OF A PARAMETER OF INTEREST OF A TARGE...
- Publication number 20190323972
- Publication date Oct 24, 2019
- ASML NETHERLANDS B.V.
- Samee Ur REHMAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING, DEVICE MANUFACTURING METHOD, METROLOGY APPARAT...
- Publication number 20190285993
- Publication date Sep 19, 2019
- ASML NETHERLANDS B.V.
- Nitesh PANDEY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF OPTIMIZING A METROLOGY PROCESS
- Publication number 20190243253
- Publication date Aug 8, 2019
- ASML NETHERLANDS B.V.
- Anagnostis TSIATMAS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF DETERMINING INFORMATION ABOUT A PATTERNING PROCESS, METHO...
- Publication number 20190171115
- Publication date Jun 6, 2019
- ASML NETHERLANDS B.V.
- Joannes Jitse VENSELAAR
- G06 - COMPUTING CALCULATING COUNTING

Samee Ur Rehman

Person

Patents Grantslast 30 patents

Method of determining information about a patterning process, metho...

Method of determining information about a patterning process, metho...

Method of determining a value of a parameter of interest of a targe...

Method of optimizing a metrology process

Metrology method, apparatus and computer program

Method of measuring, device manufacturing method, metrology apparat...

Patents Applicationslast 30 patents

METHOD FOR METROLOGY OPTIMIZATION

METHOD OF DETERMINING INFORMATION ABOUT A PATTERNING PROCESS, METHO...

METHOD OF DETERMINING A VALUE OF A PARAMETER OF INTEREST OF A TARGE...

METHOD OF MEASURING, DEVICE MANUFACTURING METHOD, METROLOGY APPARAT...

METHOD OF OPTIMIZING A METROLOGY PROCESS

METHOD OF DETERMINING INFORMATION ABOUT A PATTERNING PROCESS, METHO...