Sameet K. Shriyan

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods of creating multiple electron beams
- Patent number 11,651,934
- Issue date May 16, 2023
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shaped aperture set for multi-beam array configurations
- Patent number 11,615,939
- Issue date Mar 28, 2023
- KLA Corporation
- Tomas Plettner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of eliminating thermally induced beam drift in an electron b...
- Patent number 10,340,114
- Issue date Jul 2, 2019
- KLA-Tencor Corporation
- Sameet K Shriyan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for aberration correction in an electron beam system
- Patent number 10,224,177
- Issue date Mar 5, 2019
- KLA-Tencor Corporation
- Christopher Sears
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for cathodoluminescence-based semiconductor wafer...
- Patent number 10,018,579
- Issue date Jul 10, 2018
- KLA-Tencor Corporation
- Sameet K. Shriyan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HEIGHT SENSING SYSTEM FOR ELECTRON BEAM METROLOGY TOOL
- Publication number 20240355579
- Publication date Oct 24, 2024
- KLA Corporation
- Yeishin Tung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISTORTION REDUCTION IN A MULTI-BEAM IMAGING SYSTEM
- Publication number 20240112884
- Publication date Apr 4, 2024
- KLA Corporation
- Michael I. Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM OF IMAGE-FORMING MULTI-ELECTRON BEAMS
- Publication number 20240096586
- Publication date Mar 21, 2024
- KLA Corporation
- Xinrong JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods of Creating Multiple Electron Beams
- Publication number 20230109032
- Publication date Apr 6, 2023
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD OF FIBER LOCATION MAPPING IN A MULTI-BEAM SYSTEM
- Publication number 20230003615
- Publication date Jan 5, 2023
- KLA Corporation
- Sameet K. Shriyan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPED APERTURE SET FOR MULTI-BEAM ARRAY CONFIGURATIONS
- Publication number 20220310355
- Publication date Sep 29, 2022
- KLA Corporation
- Tomas Plettner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ELIMINATING THERMALLY INDUCED BEAM DRIFT IN AN ELECTRON B...
- Publication number 20190228944
- Publication date Jul 25, 2019
- KLA-Tencor Corporation
- Sameet K. Shriyan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Aberration Correction in an Electron Beam System
- Publication number 20160329189
- Publication date Nov 10, 2016
- KLA-Tencor Corporation
- Christopher Sears
- H01 - BASIC ELECTRIC ELEMENTS

Sameet K. Shriyan

Person

Patents Grantslast 30 patents

Systems and methods of creating multiple electron beams

Shaped aperture set for multi-beam array configurations

Method of eliminating thermally induced beam drift in an electron b...

Method and system for aberration correction in an electron beam system

System and method for cathodoluminescence-based semiconductor wafer...

Patents Applicationslast 30 patents

HEIGHT SENSING SYSTEM FOR ELECTRON BEAM METROLOGY TOOL

DISTORTION REDUCTION IN A MULTI-BEAM IMAGING SYSTEM

METHOD AND SYSTEM OF IMAGE-FORMING MULTI-ELECTRON BEAMS

Systems and Methods of Creating Multiple Electron Beams

SYSTEM AND METHOD OF FIBER LOCATION MAPPING IN A MULTI-BEAM SYSTEM

SHAPED APERTURE SET FOR MULTI-BEAM ARRAY CONFIGURATIONS

METHOD OF ELIMINATING THERMALLY INDUCED BEAM DRIFT IN AN ELECTRON B...

Method and System for Aberration Correction in an Electron Beam System