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Samuel G. Stephens
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Austin, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Method for speeding up serial data tolerance testing
Patent number
8,006,141
Issue date
Aug 23, 2011
FREESCALE SEMICONDUCTOR, INC.
Samuel G. Stephens
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for electrical testing
Patent number
7,777,509
Issue date
Aug 17, 2010
FREESCALE SEMICONDUCTOR, INC.
David E. Halter
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method for Speeding Up Serial Data Tolerance Testing
Publication number
20100332931
Publication date
Dec 30, 2010
Samuel G. Stephens
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR ELECTRICAL TESTING
Publication number
20090267624
Publication date
Oct 29, 2009
David E. Halter
G01 - MEASURING TESTING