Samuel K. Doran

Person

Putnam Valley, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Servo control for high emittance electron source
- Patent number 6,590,216
- Issue date Jul 8, 2003
- Nikon Corporation
- Samuel K. Doran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Servo guided stage system with yaw sensor
- Patent number 6,466,324
- Issue date Oct 15, 2002
- International Business Machines Corporation
- Samuel K. Doran
- G01 - MEASURING TESTING
Information Patent Grant
Real time measurement of leakage current in high voltage electron guns
- Patent number 6,456,019
- Issue date Sep 24, 2002
- Nikon Corporation
- Michael Stuart Gordon
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Precision high speed magnetic coil driver circuit
- Patent number 6,388,516
- Issue date May 14, 2002
- International Business Machines Corporation
- Samuel K. Doran
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Precision tool control system for a workpiece positioning apparatus
- Patent number 5,739,654
- Issue date Apr 14, 1998
- International Business Machines Corporation
- Samuel Kay Doran
- G05 - CONTROLLING REGULATING
Information Patent Grant
Real time alignment system for a projection electron beam lithograp...
- Patent number 5,716,742
- Issue date Feb 10, 1998
- International Business Machines Corporation
- Samuel K. Doran
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Real time alignment system for a projection electron beam lithograp...
- Patent number 5,648,188
- Issue date Jul 15, 1997
- International Business Machines Corporation
- Samuel K. Doran
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electron beam nano-metrology system
- Patent number 5,585,629
- Issue date Dec 17, 1996
- International Business Machines Corporation
- Samuel K. Doran
- G01 - MEASURING TESTING
Information Patent Grant
Compensated servo control stage positioning apparatus
- Patent number 5,548,195
- Issue date Aug 20, 1996
- International Business Machines Corporation
- Samuel K. Doran
- G05 - CONTROLLING REGULATING
Information Patent Grant
Servo guided stage system
- Patent number 5,140,242
- Issue date Aug 18, 1992
- International Business Machines Corporation
- Samuel K. Doran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam writing method and system using large range deflectio...
- Patent number 4,818,885
- Issue date Apr 4, 1989
- International Business Machines Corporation
- Donald E. Davis
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for controlling alignment and brightness of an...
- Patent number 4,568,861
- Issue date Feb 4, 1986
- International Business Machines Corporation
- Samuel K. Doran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic focus and deflection correction in E-beam system using op...
- Patent number 4,468,565
- Issue date Aug 28, 1984
- International Business Machines Corporation
- William W. Blair
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for applying focus correction in E-beam system
- Patent number 4,137,459
- Issue date Jan 30, 1979
- International Business Machines Corporation
- Drew E. Albrecht
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for automatically correcting aberrations of a bea...
- Patent number 4,066,863
- Issue date Jan 3, 1978
- International Business Machines Corporation
- Samuel K. Doran
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
REAL TIME MEASUREMENT OF LEAKAGE CURRENT IN HIGH VOLTAGE ELECTRON GUNS
- Publication number 20020145396
- Publication date Oct 10, 2002
- Michael Stuart Gordon
- B82 - NANO-TECHNOLOGY

Samuel K. Doran

Person

Patents Grantslast 30 patents

Servo control for high emittance electron source

Servo guided stage system with yaw sensor

Real time measurement of leakage current in high voltage electron guns

Precision high speed magnetic coil driver circuit

Precision tool control system for a workpiece positioning apparatus

Real time alignment system for a projection electron beam lithograp...

Real time alignment system for a projection electron beam lithograp...

Electron beam nano-metrology system

Compensated servo control stage positioning apparatus

Servo guided stage system

Electron beam writing method and system using large range deflectio...

Method and apparatus for controlling alignment and brightness of an...

Automatic focus and deflection correction in E-beam system using op...

Method and apparatus for applying focus correction in E-beam system

Method and system for automatically correcting aberrations of a bea...

Patents Applicationslast 30 patents

REAL TIME MEASUREMENT OF LEAKAGE CURRENT IN HIGH VOLTAGE ELECTRON GUNS