Samuel Kah Hean Wong

Person

Johor Bahru, MY

People

Patents Grantslast 30 patents

Information Patent Grant
Feature detection with light transmitting medium
- Patent number 10,234,400
- Issue date Mar 19, 2019
- Seagate Technology LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Imaging a transparent article
- Patent number 10,024,790
- Issue date Jul 17, 2018
- Seagate Technology LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Distinguishing foreign surface features from native surface features
- Patent number 9,863,892
- Issue date Jan 9, 2018
- Seagate Technology LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Classification of surface features using fluoresence
- Patent number 9,810,633
- Issue date Nov 7, 2017
- Seagate Technology LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for uniformly irradiating and imaging an article
- Patent number 9,784,688
- Issue date Oct 10, 2017
- Seagate Technology LLC
- Joachim Walter Ahner
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Surface features characterization
- Patent number 9,766,184
- Issue date Sep 19, 2017
- Seagate Technology LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Chemical characterization of surface features
- Patent number 9,766,179
- Issue date Sep 19, 2017
- Seagate Technology LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Distinguishing foreign surface features from native surface features
- Patent number 9,377,394
- Issue date Jun 28, 2016
- Seagate Technology LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Classification of surface features using fluorescence
- Patent number 9,297,759
- Issue date Mar 29, 2016
- Seagate Technology LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Chemical characterization of surface features
- Patent number 9,297,751
- Issue date Mar 29, 2016
- Seagate Technology LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Laminar flow plating rack
- Patent number 9,222,191
- Issue date Dec 29, 2015
- Seagate Technology LLC
- Samuel Kah Hean Wong
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Surface features characterization
- Patent number 9,212,900
- Issue date Dec 15, 2015
- Seagate Technology LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DISTINGUISHING FOREIGN SURFACE FEATURES FROM NATIVE SURFACE FEATURES
- Publication number 20160274037
- Publication date Sep 22, 2016
- SEAGATE TECHNOLOGY LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL CHARACTERIZATION OF SURFACE FEATURES
- Publication number 20160178513
- Publication date Jun 23, 2016
- SEAGATE TECHNOLOGY LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Application
CLASSIFICATION OF SURFACE FEATURES USING FLUORESENCE
- Publication number 20160169802
- Publication date Jun 16, 2016
- SEAGATE TECHNOLOGY LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Application
SURFACE FEATURES CHARACTERIZATION
- Publication number 20160077018
- Publication date Mar 17, 2016
- SEAGATE TECHNOLOGY LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Application
DISTINGUISHING FOREIGN SURFACE FEATURES FROM NATIVE SURFACE FEATURES
- Publication number 20140104604
- Publication date Apr 17, 2014
- SEAGATE TECHNOLOGY LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Application
FEATURE DETECTION WITH LIGHT TRANSMITTING MEDIUM
- Publication number 20140104603
- Publication date Apr 17, 2014
- SEAGATE TECHNOLOGY LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR IMAGING A UNIFORMLY IRRADIATED ARTICLE
- Publication number 20140098217
- Publication date Apr 10, 2014
- SEAGATE TECHNOLOGY LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL CHARACTERIZATION OF SURFACE FEATURES
- Publication number 20140098368
- Publication date Apr 10, 2014
- SEAGATE TECHNOLOGY LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Application
CLASSIFICATION OF SURFACE FEATURES USING FLUORESENCE
- Publication number 20140098364
- Publication date Apr 10, 2014
- SEAGATE TECHNOLOGY LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Application
IMAGING A TRANSPARENT ARTICLE
- Publication number 20140098370
- Publication date Apr 10, 2014
- SEAGATE TECHNOLOGY LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Application
SURFACE FEATURES CHARACTERIZATION
- Publication number 20140043621
- Publication date Feb 13, 2014
- Joachim Walter Ahner
- G01 - MEASURING TESTING

Samuel Kah Hean Wong

Person

Patents Grantslast 30 patents

Feature detection with light transmitting medium

Imaging a transparent article

Distinguishing foreign surface features from native surface features

Classification of surface features using fluoresence

Apparatus for uniformly irradiating and imaging an article

Surface features characterization

Chemical characterization of surface features

Distinguishing foreign surface features from native surface features

Classification of surface features using fluorescence

Chemical characterization of surface features

Laminar flow plating rack

Surface features characterization

Patents Applicationslast 30 patents

DISTINGUISHING FOREIGN SURFACE FEATURES FROM NATIVE SURFACE FEATURES

CHEMICAL CHARACTERIZATION OF SURFACE FEATURES

CLASSIFICATION OF SURFACE FEATURES USING FLUORESENCE

SURFACE FEATURES CHARACTERIZATION

DISTINGUISHING FOREIGN SURFACE FEATURES FROM NATIVE SURFACE FEATURES

FEATURE DETECTION WITH LIGHT TRANSMITTING MEDIUM

APPARATUS FOR IMAGING A UNIFORMLY IRRADIATED ARTICLE

CHEMICAL CHARACTERIZATION OF SURFACE FEATURES

CLASSIFICATION OF SURFACE FEATURES USING FLUORESENCE

IMAGING A TRANSPARENT ARTICLE

SURFACE FEATURES CHARACTERIZATION