Samuel Nackash

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Nes-Ziona, IL

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Patents Grantslast 30 patents

Information Patent Grant
Detection of an electric arc hazard related to a wafer
- Patent number 11,293,993
- Issue date Apr 5, 2022
- Applied Materials Israel Ltd.
- Yosef Basson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, computer program product, and method for dissipation of an...
- Patent number 10,716,197
- Issue date Jul 14, 2020
- Applied Materials Israel Ltd.
- Guy Eytan
- G01 - MEASURING TESTING
Information Patent Grant
Integrated chuck
- Patent number 9,817,208
- Issue date Nov 14, 2017
- Applied Materials Israel Ltd.
- Efim Vinnitsky
- G02 - OPTICS
Information Patent Grant
Mirror support module, a kit and a scanning electron microscope
- Patent number 9,805,906
- Issue date Oct 31, 2017
- Applied Materials Israel, Ltd.
- Efim Vinnitsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for temperature control of a semiconductor wafer
- Patent number 9,111,971
- Issue date Aug 18, 2015
- Applied Materials Israel, Ltd.
- Lavy Shavit
- F27 - FURNACES KILNS OVENS RETORTS

Patents Applicationslast 30 patents

Information Patent Application
DETECTION OF AN ELECTRIC ARC HAZARD RELATED TO A WAFER
- Publication number 20210063461
- Publication date Mar 4, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Yosef Basson
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, COMPUTER PROGRAM PRODUCT, AND METHOD FOR DISSIPATION OF AN...
- Publication number 20190090335
- Publication date Mar 21, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Guy Eytan
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEM AND METHOD FOR TEMPERATURE CONTROL OF A SEMICONDUCTOR WAFER
- Publication number 20140027437
- Publication date Jan 30, 2014
- Lavy Shavit
- H01 - BASIC ELECTRIC ELEMENTS