Samuel Rothstein

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New Hyde Park, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Rotating head profilometer probe
- Patent number 4,851,773
- Issue date Jul 25, 1989
- Samuel Rothstein
- G01 - MEASURING TESTING
Information Patent Grant
Tube inspection probe with rotating eddy current coil
- Patent number 4,625,165
- Issue date Nov 25, 1986
- Samuel Rothstein
- G01 - MEASURING TESTING