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Samuel Syn Soo Lim
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Singapore, SG
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last 30 patents
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Patent Grant
Method for testing semiconductor devices and an apparatus therefor
Patent number
7,151,388
Issue date
Dec 19, 2006
Kes Systems, Inc.
Ballson Gopal
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Method for testing semiconductor devices and an apparatus therefor
Publication number
20060066293
Publication date
Mar 30, 2006
KES Systems, Inc.
Ballson Gopal
G01 - MEASURING TESTING