Samuel Tileston WHITTEMORE

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Readfield, ME, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods, apparatus and systems for measuring snow structure and sta...
- Patent number 9,465,020
- Issue date Oct 11, 2016
- AvaTech, Inc.
- James Loren Christian
- G01 - MEASURING TESTING
Information Patent Grant
Methods, apparatus and systems for measuring snow structure and sta...
- Patent number 9,057,804
- Issue date Jun 16, 2015
- AVATECH, INC.
- James Loren Christian
- G01 - MEASURING TESTING
Information Patent Grant
Methods, apparatus and systems for measuring snow structure and sta...
- Patent number 9,057,803
- Issue date Jun 16, 2015
- AVATECH, INC.
- James Loren Christian
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS, APPARATUS AND SYSTEMS FOR MEASURING SNOW STRUCTURE AND STA...
- Publication number 20150355152
- Publication date Dec 10, 2015
- AvaTech, Inc.
- James Loren CHRISTIAN
- G01 - MEASURING TESTING
Information Patent Application
METHODS, APPARATUS AND SYSTEMS FOR MEASURING SNOW STRUCTURE AND STA...
- Publication number 20140366648
- Publication date Dec 18, 2014
- James Loren CHRISTIAN
- G01 - MEASURING TESTING
Information Patent Application
METHODS, APPARATUS AND SYSTEMS FOR MEASURING SNOW STRUCTURE AND STA...
- Publication number 20140118165
- Publication date May 1, 2014
- AVATECH, INC.
- James Loren CHRISTIAN
- G01 - MEASURING TESTING
Information Patent Application
METHODS, APPARATUS AND SYSTEMS FOR MEASURING SNOW STRUCTURE AND STA...
- Publication number 20140116127
- Publication date May 1, 2014
- AVATECH, INC.
- James Loren CHRISTIAN
- G01 - MEASURING TESTING
Information Patent Application
METHODS, APPARATUS AND SYSTEMS FOR MEASURING SNOW STRUCTURE AND STA...
- Publication number 20140116157
- Publication date May 1, 2014
- AVATECH, INC.
- James Loren CHRISTIAN
- G01 - MEASURING TESTING
Information Patent Application
METHODS, APPARATUS AND SYSTEMS FOR MEASURING SNOW STRUCTURE AND STA...
- Publication number 20140116162
- Publication date May 1, 2014
- AVATECH, INC.
- James Loren CHRISTIAN
- G01 - MEASURING TESTING