Samuel V. Tidwell

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Norcross, GA, US

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Patents Grantslast 30 patents

Information Patent Grant
X-ray particle size analyzer
- Patent number 4,920,550
- Issue date Apr 24, 1990
- Micromeritics Instrument Corporation
- James P. Olivier
- G01 - MEASURING TESTING
Information Patent Grant
Safety interlock for x-ray particle size analyzer
- Patent number 4,853,551
- Issue date Aug 1, 1989
- Micromeritics Instrument Corporation
- Jack J. Wagner
- G01 - MEASURING TESTING