Samvel Shoukourian

Person

Yerevan, AM

People

Patents Grantslast 30 patents

Information Patent Grant
Embedded memory transparent in-system built-in self-test
- Patent number 12,002,530
- Issue date Jun 4, 2024
- Synopsys, Inc.
- Grigor Tshagharyan
- G11 - INFORMATION STORAGE
Information Patent Grant
Detection of address errors in memory devices using multi-segment e...
- Patent number 11,023,310
- Issue date Jun 1, 2021
- Synopsys, Inc.
- Hayk Grigoryan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for SOC with optimal RSMA
- Patent number 10,789,398
- Issue date Sep 29, 2020
- Synopsys, Inc.
- Suren Martirosyan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
FinFET-based memory testing using multiple read operations
- Patent number 10,192,635
- Issue date Jan 29, 2019
- Synopsys, Inc.
- Grigor Tshagharyan
- G11 - INFORMATION STORAGE
Information Patent Grant
FinFET-based memory testing using multiple read operations
- Patent number 10,115,477
- Issue date Oct 30, 2018
- Synopsys, Inc.
- Grigor Tshagharyan
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing electronic memories based on fault and test algorithm perio...
- Patent number 9,831,000
- Issue date Nov 28, 2017
- Synopsys, Inc.
- Aram Hakhumyan
- G11 - INFORMATION STORAGE
Information Patent Grant
Generation of memory structural model based on memory layout
- Patent number 9,514,258
- Issue date Dec 6, 2016
- Synopsys, Inc.
- Karen Amirkhanyan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining a desirable number of segments for a multi-segment sing...
- Patent number 9,053,050
- Issue date Jun 9, 2015
- Synopsys, Inc.
- Hayk Grigoryan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting random telegraph noise induced failures in an electronic...
- Patent number 8,850,277
- Issue date Sep 30, 2014
- Synopsys, Inc.
- Karen Amirkhanyan
- G11 - INFORMATION STORAGE
Information Patent Grant
Various methods and apparatuses for memory modeling using a structu...
- Patent number 8,112,730
- Issue date Feb 7, 2012
- Synopsys, Inc.
- Karen Aleksanyan
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory modeling using an intermediate level structural description
- Patent number 7,768,840
- Issue date Aug 3, 2010
- Virage Logic Corporation
- Karen Aleksanyan
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
EMBEDDED MEMORY TRANSPARENT IN-SYSTEM BUILT-IN SELF-TEST
- Publication number 20230140090
- Publication date May 4, 2023
- Synopsys, Inc.
- Grigor TSHAGHARYAN
- G11 - INFORMATION STORAGE
Information Patent Application
FINFET-BASED MEMORY TESTING USING MULTIPLE READ OPERATIONS
- Publication number 20190035484
- Publication date Jan 31, 2019
- Synopsys, Inc.
- Grigor Tshagharyan
- G11 - INFORMATION STORAGE
Information Patent Application
Method and Apparatus for SOC with Optimal RSMA
- Publication number 20180129769
- Publication date May 10, 2018
- Synopsys, Inc.
- Suren Martirosyan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FinFET-Based Memory Testing Using Multiple Read Operations
- Publication number 20180130546
- Publication date May 10, 2018
- Synopsys, Inc.
- Grigor Tshagharyan
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING ELECTRONIC MEMORIES BASED ON FAULT AND TEST ALGORITHM PERIO...
- Publication number 20140380107
- Publication date Dec 25, 2014
- Aram Hakhumyan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Generation of Memory Structural Model Based on Memory Layout
- Publication number 20130346056
- Publication date Dec 26, 2013
- Synopsys, Inc.
- Karen Amirkhanyan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Determining A Desirable Number Of Segments For A Multi-Segment Sing...
- Publication number 20130145119
- Publication date Jun 6, 2013
- Synopsys, Inc.
- Hayk Grigoryan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTING RANDOM TELEGRAPH NOISE INDUCED FAILURES IN AN ELECTRONIC...
- Publication number 20130019132
- Publication date Jan 17, 2013
- Synopsys Inc.
- Karen AMIRKHANYAN
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING ELECTRONIC MEMORIES BASED ON FAULT AND TEST ALGORITHM PERIO...
- Publication number 20130019130
- Publication date Jan 17, 2013
- Synopsys Inc.
- Aram HAKHUMYAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VARIOUS METHODS AND APPARATUSES FOR MEMORY MODELING USING A STRUCTU...
- Publication number 20090106716
- Publication date Apr 23, 2009
- Virage Logic Corporation
- Karen Aleksanyan
- G06 - COMPUTING CALCULATING COUNTING

Samvel Shoukourian

Person

Patents Grantslast 30 patents

Embedded memory transparent in-system built-in self-test

Detection of address errors in memory devices using multi-segment e...

Method and apparatus for SOC with optimal RSMA

FinFET-based memory testing using multiple read operations

FinFET-based memory testing using multiple read operations

Testing electronic memories based on fault and test algorithm perio...

Generation of memory structural model based on memory layout

Determining a desirable number of segments for a multi-segment sing...

Detecting random telegraph noise induced failures in an electronic...

Various methods and apparatuses for memory modeling using a structu...

Memory modeling using an intermediate level structural description

Patents Applicationslast 30 patents

EMBEDDED MEMORY TRANSPARENT IN-SYSTEM BUILT-IN SELF-TEST

FINFET-BASED MEMORY TESTING USING MULTIPLE READ OPERATIONS

Method and Apparatus for SOC with Optimal RSMA

FinFET-Based Memory Testing Using Multiple Read Operations

TESTING ELECTRONIC MEMORIES BASED ON FAULT AND TEST ALGORITHM PERIO...

Generation of Memory Structural Model Based on Memory Layout

Determining A Desirable Number Of Segments For A Multi-Segment Sing...

DETECTING RANDOM TELEGRAPH NOISE INDUCED FAILURES IN AN ELECTRONIC...

TESTING ELECTRONIC MEMORIES BASED ON FAULT AND TEST ALGORITHM PERIO...

VARIOUS METHODS AND APPARATUSES FOR MEMORY MODELING USING A STRUCTU...