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Sanat Kapoor
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San Diego, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Wide-band Wilkinson divider
Patent number
10,707,827
Issue date
Jul 7, 2020
QUALCOMM Incorporated
Wolfgang Frank
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Adaptive memory calibration using bins
Patent number
8,816,742
Issue date
Aug 26, 2014
QUALCOMM Incorporated
Jagrut Viliskumar Patel
G11 - INFORMATION STORAGE
Information
Patent Grant
Clock signal generation techniques for memories that do not generat...
Patent number
7,656,743
Issue date
Feb 2, 2010
Qualcomm, Incorporated
Vaishnav Srinivas
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
WIDE-BAND WILKINSON DIVIDER
Publication number
20190214962
Publication date
Jul 11, 2019
QUALCOMM Incorporated
Wolfgang FRANK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS AND SYSTEMS TO BROADCAST SENSOR OUTPUTS IN AN AUTOMOTIVE EN...
Publication number
20190132555
Publication date
May 2, 2019
QUALCOMM Incorporated
Jeffrey Hao Chu
B60 - VEHICLES IN GENERAL
Information
Patent Application
METHOD AND APPARATUS FOR CHARACTERIZING POWER SUPPLY IMPEDANCE FOR...
Publication number
20140009990
Publication date
Jan 9, 2014
QUALCOMM Incorporated
Sanat Kapoor
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Adaptive memory calibration using bins
Publication number
20080123444
Publication date
May 29, 2008
Jagrut Viliskumar Patel
G01 - MEASURING TESTING
Information
Patent Application
Clock signal generation techniques for memories that do not generat...
Publication number
20070104015
Publication date
May 10, 2007
Vaishnav Srinivas
G11 - INFORMATION STORAGE
Information
Patent Application
Integrated circuit with adaptive speed binning
Publication number
20060238230
Publication date
Oct 26, 2006
Jagrut Viliskumar Patel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Calibrating an integrated circuit to an electronic device
Publication number
20050114725
Publication date
May 26, 2005
Qualcomm, Inc.
Jagrut V. Patel
G01 - MEASURING TESTING