Sandeep Bhagwat

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor hot-spot and process-window discovery combining optic...
- Patent number 11,055,840
- Issue date Jul 6, 2021
- KLA Corporation
- Ardis Liang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Flexible hybrid defect classification for semiconductor manufacturing
- Patent number 7,142,992
- Issue date Nov 28, 2006
- KLA-Tencor Technologies Corp.
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data analysis flow engine
- Patent number 7,093,207
- Issue date Aug 15, 2006
- KLA-Tencor Technologies Corporation
- Po-Shou Liao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spatial signature analysis
- Patent number 6,718,526
- Issue date Apr 6, 2004
- KLA-Tencor Corporation
- Peter Eldredge
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER SIGNATURE LOCAL MAXIMA VIA CLUSTERING FOR METROLOGY GUIDED IN...
- Publication number 20240362765
- Publication date Oct 31, 2024
- KLA Corporation
- Alan Davila
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Hot-Spot and Process-Window Discovery Combining Optic...
- Publication number 20210042908
- Publication date Feb 11, 2021
- KLA Corporation
- Ardis Liang
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE HYBRID DEFECT CLASSIFICATION FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20060265145
- Publication date Nov 23, 2006
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING