Sandeep Bhatia

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Parameter-based versioning for log-based block devices
- Patent number 12,164,491
- Issue date Dec 10, 2024
- Google LLC
- Sandeep Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Emulating a non-relational database on a relational database with a...
- Patent number 12,093,276
- Issue date Sep 17, 2024
- Amazon Technologies, Inc.
- Andrew James Whitaker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Atomic partition scheme updates to store items in partitions of a t...
- Patent number 11,609,933
- Issue date Mar 21, 2023
- Amazon Technologies, Inc.
- Mustafa Ozan Ozen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Partition splitting in a distributed database
- Patent number 11,263,184
- Issue date Mar 1, 2022
- Amazon Technologies, Inc.
- Mustafa Ozan Ozen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Moving database partitions from replica nodes
- Patent number 11,232,000
- Issue date Jan 25, 2022
- Amazon Technologies, Inc.
- Sandeep Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic distributed data clustering using multi-level hash trees
- Patent number 11,120,052
- Issue date Sep 14, 2021
- Amazon Technologies, Inc.
- Mustafa Ozan Ozen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Performance-based query plan caching
- Patent number 11,093,496
- Issue date Aug 17, 2021
- Amazon Technologies, Inc.
- Sandeep Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data re-sharding
- Patent number 11,030,169
- Issue date Jun 8, 2021
- Amazon Technologies, Inc.
- Ming-Chuan Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-type attribute index for a document database
- Patent number 10,929,396
- Issue date Feb 23, 2021
- Amazon Technologies, Inc.
- Sandeep Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic data layouts for time-series data
- Patent number 10,853,373
- Issue date Dec 1, 2020
- Amazon Technologies, Inc.
- Sandeep Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating filters based upon item attributes
- Patent number 10,672,024
- Issue date Jun 2, 2020
- Amazon Technologies, Inc.
- Sandeep Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Delivery confirmation using overlapping geo-fences
- Patent number 10,445,685
- Issue date Oct 15, 2019
- Amazon Technologies, Inc.
- Sandeep Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Splitting processing responsibility for separately stored data part...
- Patent number 10,409,648
- Issue date Sep 10, 2019
- Amazon Technologies, Inc.
- Sandeep Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Requesting an item available from a network-based resource
- Patent number 10,223,721
- Issue date Mar 5, 2019
- Amazon Technologies, Inc.
- Sandeep Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ordering a set of data associated with an item
- Patent number 10,089,674
- Issue date Oct 2, 2018
- Amazon Technologies, Inc.
- Sandeep Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rules recommendation based on customer feedback
- Patent number 9,984,386
- Issue date May 29, 2018
- Amazon Technologies, Inc.
- Sandeep Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Delivery confirmation using overlapping geo-fences
- Patent number 9,699,606
- Issue date Jul 4, 2017
- Amazon Technologies, Inc.
- Sandeep Bhatia
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and mechanism for implementing electronic designs having pow...
- Patent number RE44479
- Issue date Sep 3, 2013
- Cadence Design Systems, Inc.
- Qi Wang
- 716 - Computer-aided design and analysis of circuits and semiconductor masks
Information Patent Grant
Method and mechanism for implementing electronic designs having pow...
- Patent number 8,516,422
- Issue date Aug 20, 2013
- Cadence Design Systems, Inc.
- Qi Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for scan testing of integrated circuits with scan registers
- Patent number 8,078,925
- Issue date Dec 13, 2011
- Cadence Design Systems, Inc.
- Sandeep Bhatia
- G01 - MEASURING TESTING
Information Patent Grant
Scan testing architectures for power-shutoff aware systems
- Patent number 8,001,433
- Issue date Aug 16, 2011
- Cadence Design Systems, Inc.
- Sandeep Bhatia
- G01 - MEASURING TESTING
Information Patent Grant
Test compaction using linear-matrix driven scan chains
- Patent number 7,925,941
- Issue date Apr 12, 2011
- Cadence Design Systems, Inc.
- Sandeep Bhatia
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for scan testing of integrated circuits with...
- Patent number 7,743,298
- Issue date Jun 22, 2010
- Cadence Design Systems, Inc.
- Sandeep Bhatia
- G01 - MEASURING TESTING
Information Patent Grant
Method and mechanism for implementing electronic designs having pow...
- Patent number 7,739,629
- Issue date Jun 15, 2010
- Cadence Design Systems, Inc.
- Qi Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low power scan test for integrated circuits
- Patent number 7,693,676
- Issue date Apr 6, 2010
- Cadence Design Systems, Inc.
- Brion L. Keller
- G01 - MEASURING TESTING
Information Patent Grant
Dual scan chain design method and apparatus
- Patent number 7,657,809
- Issue date Feb 2, 2010
- Cadence Design Systems, Inc.
- Sandeep Bhatia
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for clock skew independent scan register chains
- Patent number 7,613,969
- Issue date Nov 3, 2009
- Cadence Design Systems, Inc.
- Sandeep Bhatia
- G01 - MEASURING TESTING
Information Patent Grant
Test compaction using linear-matrix driven scan chains
- Patent number 7,584,392
- Issue date Sep 1, 2009
- Cadence Design Systems, Inc.
- Sandeep Bhatia
- G01 - MEASURING TESTING
Information Patent Grant
Scan register and methods of using the same
- Patent number 7,457,998
- Issue date Nov 25, 2008
- Cadence Design Systems, Inc.
- Sandeep Bhatia
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Parameter Based Versioning for Log-Based Block Devices
- Publication number 20250103570
- Publication date Mar 27, 2025
- Google LLC
- Sandeep Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Parameter-Based Versioning For Log-Based Block Devices
- Publication number 20240193141
- Publication date Jun 13, 2024
- Google LLC
- Sandeep Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA MANAGEMENT PLATFORM FOR MACHINE LEARNING MODELS
- Publication number 20200349468
- Publication date Nov 5, 2020
- Apple Inc.
- Rajat ARYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DELIVERY CONFIRMATION USING OVERLAPPING GEO-FENCES
- Publication number 20170372261
- Publication date Dec 28, 2017
- AMAZON TECHNOLOGIES, INC.
- Sandeep Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST COMPACTION USING LINEAR-MATRIX DRIVEN SCAN CHAINS
- Publication number 20100058129
- Publication date Mar 4, 2010
- Cadence Design Systems, Inc.
- Sandeep Bhatia
- G01 - MEASURING TESTING
Information Patent Application
Method and mechanism for implementing electronic designs having pow...
- Publication number 20070245285
- Publication date Oct 18, 2007
- Qi Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for clock skew independent scan register chains
- Publication number 20060095819
- Publication date May 4, 2006
- Cadence Design Systems, Inc.
- Sandeep Bhatia
- G01 - MEASURING TESTING
Information Patent Application
Test compaction using linear-matrix driven scan chains
- Publication number 20040237014
- Publication date Nov 25, 2004
- Sandeep Bhatia
- G01 - MEASURING TESTING

Sandeep Bhatia

Person

Patents Grantslast 30 patents

Parameter-based versioning for log-based block devices

Emulating a non-relational database on a relational database with a...

Atomic partition scheme updates to store items in partitions of a t...

Partition splitting in a distributed database

Moving database partitions from replica nodes

Dynamic distributed data clustering using multi-level hash trees

Performance-based query plan caching

Data re-sharding

Multi-type attribute index for a document database

Dynamic data layouts for time-series data

Generating filters based upon item attributes

Delivery confirmation using overlapping geo-fences

Splitting processing responsibility for separately stored data part...

Requesting an item available from a network-based resource

Ordering a set of data associated with an item

Rules recommendation based on customer feedback

Delivery confirmation using overlapping geo-fences

Method and mechanism for implementing electronic designs having pow...

Method and mechanism for implementing electronic designs having pow...

Apparatus for scan testing of integrated circuits with scan registers

Scan testing architectures for power-shutoff aware systems

Test compaction using linear-matrix driven scan chains

Methods and apparatus for scan testing of integrated circuits with...

Method and mechanism for implementing electronic designs having pow...

Low power scan test for integrated circuits

Dual scan chain design method and apparatus

Method and system for clock skew independent scan register chains

Test compaction using linear-matrix driven scan chains

Scan register and methods of using the same

Patents Applicationslast 30 patents

Parameter Based Versioning for Log-Based Block Devices

Parameter-Based Versioning For Log-Based Block Devices

DATA MANAGEMENT PLATFORM FOR MACHINE LEARNING MODELS

DELIVERY CONFIRMATION USING OVERLAPPING GEO-FENCES

TEST COMPACTION USING LINEAR-MATRIX DRIVEN SCAN CHAINS

Method and mechanism for implementing electronic designs having pow...

Method and system for clock skew independent scan register chains

Test compaction using linear-matrix driven scan chains