Sandeep Kumar Goel

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West Hollywood, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and device for reducing instantaneous voltage droop during a...
- Patent number 8,627,160
- Issue date Jan 7, 2014
- LSI Corporation
- Narendra Devta-Prasanna
- G01 - MEASURING TESTING
Information Patent Grant
Method and an apparatus for evaluating small delay defect coverage...
- Patent number 8,515,695
- Issue date Aug 20, 2013
- LSI Corporation
- Narendra B. Devta-Prasanna
- G01 - MEASURING TESTING
Information Patent Grant
Method for generating test patterns for small delay defects
- Patent number 8,352,818
- Issue date Jan 8, 2013
- LSI Corporation
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit and method for testing of infant mortality related def...
- Patent number 8,140,923
- Issue date Mar 20, 2012
- LSI Corporation
- Sandeep Kumar Goel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND DEVICE FOR REDUCING INSTANTANEOUS VOLTAGE DROOP DURING A...
- Publication number 20110260767
- Publication date Oct 27, 2011
- Narendra Devta-Prasanna
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST CIRCUIT AND METHOD FOR TESTING OF INFANT MORTALITY RELATED DEF...
- Publication number 20100262876
- Publication date Oct 14, 2010
- LSI Corporation
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND AN APPARATUS FOR EVALUATING SMALL DELAY DEFECT COVERAGE...
- Publication number 20100262394
- Publication date Oct 14, 2010
- LSI Corporation
- Narendra B. Devta-Prasanna
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR GENERATING TEST PATTERNS FOR SMALL DELAY DEFECTS
- Publication number 20100153795
- Publication date Jun 17, 2010
- LSI Corporation
- Sandeep Kumar Goel
- G01 - MEASURING TESTING