Sandeep Kumar Goel

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Testing of an integrated circuit that contains secret information
- Patent number 9,041,411
- Issue date May 26, 2015
- NXP B.V.
- Erik J. Marinissen
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit and method for hierarchical core
- Patent number 7,380,181
- Issue date May 27, 2008
- NXP B.V.
- Sandeep K. Goel
- G01 - MEASURING TESTING
Information Patent Grant
Testing of circuit with plural clock domains
- Patent number 7,076,709
- Issue date Jul 11, 2006
- Koninklijke Philips Electronics N.V.
- Hubertus Gerardus Hendrikus Vermeulen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test circuit and method for hierarchical core
- Publication number 20070208971
- Publication date Sep 6, 2007
- Koninklijke Philips Electronics N.V.
- Sandeep K. Goel
- G01 - MEASURING TESTING
Information Patent Application
Testing of circuit with plural clock domains
- Publication number 20050076278
- Publication date Apr 7, 2005
- Hubertus Gerardus Hendrikus Vermeulen
- G01 - MEASURING TESTING