Sandeep Kumar Goel

Person

Hsinchu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for ESL modeling of machine learning
- Patent number 12,014,130
- Issue date Jun 18, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Kai-Yuan Ting
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of testing an integrated circuit and testing system
- Patent number 11,879,933
- Issue date Jan 23, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit design method, system and computer program product
- Patent number 11,727,177
- Issue date Aug 15, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for reducing migration errors
- Patent number 11,699,010
- Issue date Jul 11, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Sandeep Kumar Goel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power-aware scan partitioning
- Patent number 11,386,253
- Issue date Jul 12, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit design method, system and computer program product
- Patent number 11,379,643
- Issue date Jul 5, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fault diagnostics
- Patent number 11,068,633
- Issue date Jul 20, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Sandeep Kumar Goel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for determining systematic defects
- Patent number 10,871,518
- Issue date Dec 22, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Sandeep Kumar Goel
- G11 - INFORMATION STORAGE
Information Patent Grant
Power-aware scan partitioning
- Patent number 10,685,157
- Issue date Jun 16, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SCAN CHAINS WITH MULTI-BIT CELLS AND METHODS FOR TESTING THE SAME
- Publication number 20250020719
- Publication date Jan 16, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Mohammed Moiz Khan
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ESL MODELING OF MACHINE LEARNING
- Publication number 20240338506
- Publication date Oct 10, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kai-Yuan TING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM
- Publication number 20240094281
- Publication date Mar 21, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ankita PATIDAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT DESIGN METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT
- Publication number 20230376660
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ankita PATIDAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR REDUCING MIGRATION ERRORS
- Publication number 20230351081
- Publication date Nov 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sandeep Kumar GOEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM
- Publication number 20230003790
- Publication date Jan 5, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ankita PATIDAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT DESIGN METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT
- Publication number 20220300689
- Publication date Sep 22, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ankita PATIDAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT DESIGN METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT
- Publication number 20220138385
- Publication date May 5, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ankita PATIDAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR REDUCING MIGRATION ERRORS
- Publication number 20210326502
- Publication date Oct 21, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sandeep Kumar GOEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR ESL MODELING OF MACHINE LEARNING
- Publication number 20210089696
- Publication date Mar 25, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kai-Yuan TING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER-AWARE SCAN PARTITIONING
- Publication number 20200311329
- Publication date Oct 1, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAULT DIAGNOSTICS
- Publication number 20200072901
- Publication date Mar 5, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sandeep Kumar Goel
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR DETERMINING SYSTEMATIC DEFECTS
- Publication number 20190113573
- Publication date Apr 18, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sandeep Kumar Goel
- G11 - INFORMATION STORAGE
Information Patent Application
POWER-AWARE SCAN PARTITIONING
- Publication number 20190094303
- Publication date Mar 28, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ankita Patidar
- G01 - MEASURING TESTING

Sandeep Kumar Goel

Person

Patents Grantslast 30 patents

System and method for ESL modeling of machine learning

Method of testing an integrated circuit and testing system

Integrated circuit design method, system and computer program product

Method and system for reducing migration errors

Power-aware scan partitioning

Integrated circuit design method, system and computer program product

Fault diagnostics

Systems and methods for determining systematic defects

Power-aware scan partitioning

Patents Applicationslast 30 patents

SCAN CHAINS WITH MULTI-BIT CELLS AND METHODS FOR TESTING THE SAME

SYSTEM AND METHOD FOR ESL MODELING OF MACHINE LEARNING

METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM

INTEGRATED CIRCUIT DESIGN METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT

METHOD AND SYSTEM FOR REDUCING MIGRATION ERRORS

METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM

INTEGRATED CIRCUIT DESIGN METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT

INTEGRATED CIRCUIT DESIGN METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT

METHOD AND SYSTEM FOR REDUCING MIGRATION ERRORS

SYSTEM AND METHOD FOR ESL MODELING OF MACHINE LEARNING

POWER-AWARE SCAN PARTITIONING

FAULT DIAGNOSTICS

SYSTEMS AND METHODS FOR DETERMINING SYSTEMATIC DEFECTS

POWER-AWARE SCAN PARTITIONING