Sandeep Kumar Goel

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wrapper cell design and built-in self-test architecture for 3DIC te...
- Patent number 12,066,490
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Anshuman Chandra
- G01 - MEASURING TESTING
Information Patent Grant
Scan architecture for interconnect testing in 3D integrated circuits
- Patent number 11,899,064
- Issue date Feb 13, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods to detect cell-internal defects
- Patent number 11,837,308
- Issue date Dec 5, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device with self-authentication
- Patent number 11,831,781
- Issue date Nov 28, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Haohua Zhou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Fault diagnostics
- Patent number 11,663,387
- Issue date May 30, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Sandeep Kumar Goel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test probing structure
- Patent number 11,585,831
- Issue date Feb 21, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mill-Jer Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scan architecture for interconnect testing in 3D integrated circuits
- Patent number 11,549,984
- Issue date Jan 10, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Grant
Network-on-chip system and a method of generating the same
- Patent number 11,496,417
- Issue date Nov 8, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Ravi Venugopalan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Phase-locked loop monitor circuit
- Patent number 11,411,571
- Issue date Aug 9, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sandeep Kumar Goel
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Function safety and fault management modeling at electrical system...
- Patent number 11,354,465
- Issue date Jun 7, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kai-Yuan Ting
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing apparatus having overlapping sub-regions
- Patent number 11,343,433
- Issue date May 24, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Sandeep Kumar Goel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Systems and methods to detect cell-internal defects
- Patent number 11,295,831
- Issue date Apr 5, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic frequency scaling
- Patent number 11,231,767
- Issue date Jan 25, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kai-Yuan Ting
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power estimation
- Patent number 11,163,351
- Issue date Nov 2, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kai-Yuan Ting
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine-learning based scan design enablement platform
- Patent number 11,113,444
- Issue date Sep 7, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sandeep Kumar Goel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for reducing migration errors
- Patent number 11,055,455
- Issue date Jul 6, 2021
- Taiwan Semiconductor Manufacturing Company Ltd.
- Sandeep Kumar Goel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Phase-locked loop monitor circuit
- Patent number 11,025,261
- Issue date Jun 1, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sandeep Kumar Goel
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Device with self-authentication
- Patent number 10,985,922
- Issue date Apr 20, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Haohua Zhou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for ESL modeling of machine learning
- Patent number 10,867,098
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Kai-Yuan Ting
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrical system level (ESL) battery discharge simulation
- Patent number 10,867,089
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Charlie Zhou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test probing structure
- Patent number 10,782,318
- Issue date Sep 22, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mill-Jer Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Function safety and fault management modeling at electrical system...
- Patent number 10,776,538
- Issue date Sep 15, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kai-Yuan Ting
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for system-level parameter estimation
- Patent number 10,719,648
- Issue date Jul 21, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Tze-Chiang Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Phase-locked loop monitor circuit
- Patent number 10,680,627
- Issue date Jun 9, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sandeep Kumar Goel
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Network-on-chip system and a method of generating the same
- Patent number 10,666,578
- Issue date May 26, 2020
- Taiwan Semiconductor Manufacturing Company Limited
- Ravi Venugopalan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Scan architecture for interconnect testing in 3D integrated circuits
- Patent number 10,539,617
- Issue date Jan 21, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Grant
Image processing apparatus on integrated circuit and method thereof
- Patent number 10,440,281
- Issue date Oct 8, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd
- Sandeep Kumar Goel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Circuit and method for diagnosing scan chain failures
- Patent number 10,371,751
- Issue date Aug 6, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Grant
Power estimation
- Patent number 10,345,883
- Issue date Jul 9, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kai-Yuan Ting
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for functional safety verification
- Patent number 10,267,857
- Issue date Apr 23, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Sandeep Kumar Goel
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
FUNCTION SAFETY AND FAULT MANAGEMENT MODELING AT ELECTRICAL SYSTEM...
- Publication number 20240394440
- Publication date Nov 28, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Kai-Yuan TING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wrapper Cell Design and Built-In Self-Test Architecture for 3DIC Te...
- Publication number 20240361385
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Anshuman Chandra
- G01 - MEASURING TESTING
Information Patent Application
NETWORK-ON-CHIP SYSTEM AND A METHOD OF GENERATING THE SAME
- Publication number 20240205168
- Publication date Jun 20, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- RAVI VENUGOPALAN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS
- Publication number 20240133951
- Publication date Apr 25, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Sandeep Kumar GOEL
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS
- Publication number 20240087668
- Publication date Mar 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE WITH SELF-AUTHENTICATION
- Publication number 20240022427
- Publication date Jan 18, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Haohua Zhou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
FAULT DIAGNOSTICS
- Publication number 20230385498
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sandeep Kumar Goel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wrapper Cell Design and Built-In Self-Test Architecture for 3DIC Te...
- Publication number 20230366930
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Anshuman Chandra
- G01 - MEASURING TESTING
Information Patent Application
SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS
- Publication number 20230113905
- Publication date Apr 13, 2023
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Sandeep Kumar GOEL
- G01 - MEASURING TESTING
Information Patent Application
NETWORK-ON-CHIP SYSTEM AND A METHOD OF GENERATING THE SAME
- Publication number 20230055629
- Publication date Feb 23, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- RAVI VENUGOPALAN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEMS AND METHODS FOR MODELING VIA DEFECT
- Publication number 20230019641
- Publication date Jan 19, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Cheng-Yi LIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FUNCTION SAFETY AND FAULT MANAGEMENT MODELING AT ELECTRICAL SYSTEM...
- Publication number 20220292237
- Publication date Sep 15, 2022
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Kai-Yuan TING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAULT DETECTION OF CIRCUIT BASED ON VIRTUAL DEFECTS
- Publication number 20220237353
- Publication date Jul 28, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Yue Tian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS
- Publication number 20220230699
- Publication date Jul 21, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS
- Publication number 20210407614
- Publication date Dec 30, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Ankita Patidar
- G11 - INFORMATION STORAGE
Information Patent Application
FAULT DIAGNOSTICS
- Publication number 20210350055
- Publication date Nov 11, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sandeep Kumar Goel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHASE-LOCKED LOOP MONITOR CIRCUIT
- Publication number 20210281268
- Publication date Sep 9, 2021
- Taiwan Semiconductor Manufacturing Co., LTD
- Sandeep Kumar GOEL
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DEVICE WITH SELF-AUTHENTICATION
- Publication number 20210218577
- Publication date Jul 15, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Haohua Zhou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND SYSTEM FOR REDUCING MIGRATION ERRORS
- Publication number 20210192112
- Publication date Jun 24, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sandeep Kumar GOEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FUNCTION SAFETY AND FAULT MANAGEMENT MODELING AT ELECTRICAL SYSTEM...
- Publication number 20200410144
- Publication date Dec 31, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kai-Yuan TING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST PROBING STRUCTURE
- Publication number 20200379013
- Publication date Dec 3, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Mill-Jer WANG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ESL MODELING OF MACHINE LEARNING
- Publication number 20200372124
- Publication date Nov 26, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kai-Yuan TING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHASE-LOCKED LOOP MONITOR CIRCUIT
- Publication number 20200304133
- Publication date Sep 24, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Sandeep Kumar GOEL
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
NETWORK-ON-CHIP SYSTEM AND A METHOD OF GENERATING THE SAME
- Publication number 20200280527
- Publication date Sep 3, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- RAVI VENUGOPALAN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS
- Publication number 20200124668
- Publication date Apr 23, 2020
- Sandeep Kumar GOEL
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING APPARATUS AND METHOD
- Publication number 20200036879
- Publication date Jan 30, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sandeep Kumar GOEL
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MACHINE-LEARNING BASED SCAN DESIGN ENABLEMENT PLATFORM
- Publication number 20200004913
- Publication date Jan 2, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sandeep Kumar GOEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER ESTIMATION
- Publication number 20190332161
- Publication date Oct 31, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kai-Yuan TING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHASE-LOCKED LOOP MONITOR CIRCUIT
- Publication number 20190229737
- Publication date Jul 25, 2019
- Taiwan Semiconductor Manufacturing Co., LTD
- Sandeep Kumar GOEL
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DEVICE WITH SELF-AUTHENTICATION
- Publication number 20190103974
- Publication date Apr 4, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Haohua Zhou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Sandeep Kumar Goel

Person

Patents Grantslast 30 patents

Wrapper cell design and built-in self-test architecture for 3DIC te...

Scan architecture for interconnect testing in 3D integrated circuits

Systems and methods to detect cell-internal defects

Device with self-authentication

Fault diagnostics

Test probing structure

Scan architecture for interconnect testing in 3D integrated circuits

Network-on-chip system and a method of generating the same

Phase-locked loop monitor circuit

Function safety and fault management modeling at electrical system...

Image processing apparatus having overlapping sub-regions

Systems and methods to detect cell-internal defects

Dynamic frequency scaling

Power estimation

Machine-learning based scan design enablement platform

Method and system for reducing migration errors

Phase-locked loop monitor circuit

Device with self-authentication

System and method for ESL modeling of machine learning

Electrical system level (ESL) battery discharge simulation

Test probing structure

Function safety and fault management modeling at electrical system...

System and method for system-level parameter estimation

Phase-locked loop monitor circuit

Network-on-chip system and a method of generating the same

Scan architecture for interconnect testing in 3D integrated circuits

Image processing apparatus on integrated circuit and method thereof

Circuit and method for diagnosing scan chain failures

Power estimation

Method and system for functional safety verification

Patents Applicationslast 30 patents

FUNCTION SAFETY AND FAULT MANAGEMENT MODELING AT ELECTRICAL SYSTEM...

Wrapper Cell Design and Built-In Self-Test Architecture for 3DIC Te...

NETWORK-ON-CHIP SYSTEM AND A METHOD OF GENERATING THE SAME

SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS

SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS

DEVICE WITH SELF-AUTHENTICATION

FAULT DIAGNOSTICS

Wrapper Cell Design and Built-In Self-Test Architecture for 3DIC Te...

SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS

NETWORK-ON-CHIP SYSTEM AND A METHOD OF GENERATING THE SAME

SYSTEMS AND METHODS FOR MODELING VIA DEFECT

FUNCTION SAFETY AND FAULT MANAGEMENT MODELING AT ELECTRICAL SYSTEM...

FAULT DETECTION OF CIRCUIT BASED ON VIRTUAL DEFECTS

SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS

SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS

FAULT DIAGNOSTICS

PHASE-LOCKED LOOP MONITOR CIRCUIT

DEVICE WITH SELF-AUTHENTICATION

METHOD AND SYSTEM FOR REDUCING MIGRATION ERRORS

FUNCTION SAFETY AND FAULT MANAGEMENT MODELING AT ELECTRICAL SYSTEM...

TEST PROBING STRUCTURE

SYSTEM AND METHOD FOR ESL MODELING OF MACHINE LEARNING

PHASE-LOCKED LOOP MONITOR CIRCUIT

NETWORK-ON-CHIP SYSTEM AND A METHOD OF GENERATING THE SAME

SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS

IMAGE PROCESSING APPARATUS AND METHOD

MACHINE-LEARNING BASED SCAN DESIGN ENABLEMENT PLATFORM

POWER ESTIMATION

PHASE-LOCKED LOOP MONITOR CIRCUIT

DEVICE WITH SELF-AUTHENTICATION