Sander Frederik Wuister

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Imprint lithography
- Patent number 12,147,162
- Issue date Nov 19, 2024
- ASML Netherlands B.V.
- Catharinus De Schiffart
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Systems and methods for reducing resist model prediction errors
- Patent number 11,966,167
- Issue date Apr 23, 2024
- ASML Netherlands B.V.
- Marleen Kooiman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Systems and methods for predicting layer deformation
- Patent number 11,880,640
- Issue date Jan 23, 2024
- ASML Netherlands B.V.
- Chrysostomos Batistakis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection tool and inspection method
- Patent number 11,668,661
- Issue date Jun 6, 2023
- ASML Netherlands B.V.
- Thomas Jarik Huisman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imprint lithography
- Patent number 11,635,696
- Issue date Apr 25, 2023
- ASML Netherlands B.V.
- Catharinus De Schiffart
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Systems and methods for predicting layer deformation
- Patent number 11,625,520
- Issue date Apr 11, 2023
- ASML Netherlands B.V.
- Chrysostomos Batistakis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lithographic patterning process and resists to use therein
- Patent number 11,415,886
- Issue date Aug 16, 2022
- ASML Netherlands B.V.
- Sander Frederik Wuister
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for controlling a manufacturing apparatus and associated app...
- Patent number 11,016,399
- Issue date May 25, 2021
- ASML Netherlands B.V.
- Marleen Kooiman
- G01 - MEASURING TESTING
Information Patent Grant
Imprint lithography
- Patent number 10,908,510
- Issue date Feb 2, 2021
- ASML Netherlands B.V.
- Catharinus De Schiffart
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Imprint lithography
- Patent number 10,890,851
- Issue date Jan 12, 2021
- ASML Netherlands B.V.
- Catharinus De Schiffart
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of designing lithography features by self-assembly of block...
- Patent number 10,884,333
- Issue date Jan 5, 2021
- ASML Netherlands B.V.
- Sander Frederik Wuister
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Imprint lithography apparatus and method
- Patent number 10,712,678
- Issue date Jul 14, 2020
- ASML Netherlands B.V.
- Yvonne Wendela Kruijt-Stegeman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Imprint lithography
- Patent number 10,654,217
- Issue date May 19, 2020
- ASML Netherlands B.V.
- Yvonne Wendela Kruijt-Stegeman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methodology to generate a guiding template for directed self-assembly
- Patent number 10,642,152
- Issue date May 5, 2020
- ASML Netherlands B.V.
- Sander Frederik Wuister
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for providing lithography features on a substrate by self-a...
- Patent number 10,551,736
- Issue date Feb 4, 2020
- ASML Netherlands B.V.
- Jozef Maria Finders
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for providing patterned orientation templates for self-asse...
- Patent number 10,538,859
- Issue date Jan 21, 2020
- ASML Netherlands B.V.
- Emiel Peeters
- C30 - CRYSTAL GROWTH
Information Patent Grant
Lithographic patterning process and resists to use therein
- Patent number 10,416,555
- Issue date Sep 17, 2019
- ASML Netherlands B.V.
- Sander Frederik Wuister
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods for providing lithography features on a substrate by self-a...
- Patent number 10,410,914
- Issue date Sep 10, 2019
- ASML Netherlands B.V.
- Sander Frederik Wuister
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Methodology to generate guiding templates for directed self-assembly
- Patent number 10,339,260
- Issue date Jul 2, 2019
- ASML Netherlands B.V.
- Bart Laenens
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method to provide a patterned orientation template for a self-assem...
- Patent number 10,240,250
- Issue date Mar 26, 2019
- ASML Netherlands B.V.
- Thanh Trung Nguyen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Imprint lithography alignment method and apparatus
- Patent number 10,222,693
- Issue date Mar 5, 2019
- ASML Netherlands B.V.
- Johan Frederik Dijksman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of simulating formation of lithography features by self-asse...
- Patent number 10,127,336
- Issue date Nov 13, 2018
- ASML Netherlands B.V.
- Sander Frederik Wuister
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imprint lithography
- Patent number 9,958,774
- Issue date May 1, 2018
- ASML Netherlands B.V.
- Arie Jeffrey Den Boef
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Imprint lithography
- Patent number 9,927,699
- Issue date Mar 27, 2018
- ASML Netherlands B.V.
- Sander Frederik Wuister
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Imprint lithography
- Patent number 9,889,597
- Issue date Feb 13, 2018
- ASML Netherlands B.V.
- Yvonne Wendela Kruijt-Stegeman
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Imprint lithography
- Patent number 9,864,279
- Issue date Jan 9, 2018
- ASML Netherlands B.V.
- Catharinus De Schiffart
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Imprint lithography apparatus and method
- Patent number 9,726,973
- Issue date Aug 8, 2017
- ASML Netherlands B.V.
- Sander Frederik Wuister
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Imprint lithography
- Patent number 9,662,678
- Issue date May 30, 2017
- ASML Netherlands B.V.
- Ivar Schram
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods for providing lithography features on a substrate by self-a...
- Patent number 9,666,443
- Issue date May 30, 2017
- ASML Netherlands B.V.
- Sander Frederik Wuister
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Lithographic apparatus, programmable patterning device and lithogra...
- Patent number 9,645,502
- Issue date May 9, 2017
- ASML Netherlands B.V.
- Pieter Willem Herman De Jager
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR PREDICTING LAYER DEFORMATION
- Publication number 20230222273
- Publication date Jul 13, 2023
- ASML NETHERLANDS B.V.
- Chrysostomos BATISTAKIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMPRINT LITHOGRAPHY
- Publication number 20230221651
- Publication date Jul 13, 2023
- ASML NETHERLANDS B.V.
- Catharinus DE SCHIFFART
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
IMPRINT LITHOGRAPHY
- Publication number 20210096468
- Publication date Apr 1, 2021
- ASML NETHERLANDS B.V.
- Catharinus DE SCHIFFART
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR FORMING A PATTERNED LAYER OF MATERIAL
- Publication number 20210079519
- Publication date Mar 18, 2021
- ASML NETHERLANDS B.V.
- Pieter Willem Herman DE JAGER
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
INSPECTION TOOL AND INSPECTION METHOD
- Publication number 20210003521
- Publication date Jan 7, 2021
- ASML NETHERLANDS B.V.
- Thomas Jarik HUISMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR REDUCING RESIST MODEL PREDICTION ERRORS
- Publication number 20200348598
- Publication date Nov 5, 2020
- ASML NETHERLANDS B.V.
- Marleen KOOIMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR PREDICTING LAYER DEFORMATION
- Publication number 20200320238
- Publication date Oct 8, 2020
- ASML NETHERLANDS B.V.
- Chrysostomos BATISTAKIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CONTROLLING A MANUFACTURING APPARATUS AND ASSOCIATED APP...
- Publication number 20200310254
- Publication date Oct 1, 2020
- ASML NETHERLANDS B.V.
- Marleen KOOIMAN
- G01 - MEASURING TESTING
Information Patent Application
IMPRINT LITHOGRAPHY
- Publication number 20190377265
- Publication date Dec 12, 2019
- ASML NETHERLANDS B.V.
- Catharinus De Schiffart
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Lithographic Patterning Process and Resists to Use Therein
- Publication number 20190339615
- Publication date Nov 7, 2019
- ASML NETHERLANDS B.V.
- Sander Frederik WUISTER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
RESIST COMPOSITIONS
- Publication number 20190129301
- Publication date May 2, 2019
- ASML NETHERLANDS B.V.
- Willem-Pieter VOORTHUIJZEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPRINT LITHOGRAPHY
- Publication number 20180162040
- Publication date Jun 14, 2018
- ASML NETHERLANDS B.V.
- Yvonne Wendela KRUIJT-STEGEMAN
- B82 - NANO-TECHNOLOGY
Information Patent Application
IMPRINT LITHOGRAPHY
- Publication number 20180088468
- Publication date Mar 29, 2018
- ASML NETHERLANDS B.V.
- Catharinus De Schiffart
- B82 - NANO-TECHNOLOGY
Information Patent Application
Lithographic Patterning Process and Resists to Use Therein
- Publication number 20180004085
- Publication date Jan 4, 2018
- ASML NETHERLANDS B.V.
- Sander Frederik WUISTER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS FOR PROVIDING LITHOGRAPHY FEATURES ON A SUBSTRATE BY SELF-A...
- Publication number 20170200638
- Publication date Jul 13, 2017
- ASML NETHERLANDS B.V.
- Sander Frederik WUISTER
- C30 - CRYSTAL GROWTH
Information Patent Application
IMPRINT LITHOGRAPHY
- Publication number 20160377997
- Publication date Dec 29, 2016
- ASML NETHERLANDS B.V.
- Arie Jeffrey DEN BOEF
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODOLOGY TO GENERATE A GUIDING TEMPLATE FOR DIRECTED SELF-ASSEMBLY
- Publication number 20160266486
- Publication date Sep 15, 2016
- ASML Netherland B.V.
- Sander Frederik WUISTER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODOLOGY TO GENERATE GUIDING TEMPLATES FOR DIRECTED SELF-ASSEMBLY
- Publication number 20160210397
- Publication date Jul 21, 2016
- ASML NETHERLANDS B.V.
- Bart LAENENS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMPRINT LITHOGRAPHY APPARATUS AND METHOD
- Publication number 20160195823
- Publication date Jul 7, 2016
- ASML NETHERLANDS B.V.
- Yvonne Wendela KRUIJT-STEGEMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF DESIGNING LITHOGRAPHY FEATURES BY SELF-ASSEMBLY OF BLOCK...
- Publication number 20160178999
- Publication date Jun 23, 2016
- ASML NETHERLANDS B.V.
- Sander Frederik WUISTER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF SIMULATING FORMATION OF LITHOGRAPHY FEATURES BY SELF-ASSE...
- Publication number 20160078160
- Publication date Mar 17, 2016
- ASML NETHERLANDS B.V.
- Sander Frederik WUISTER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR PROVIDING LITHOGRAPHY FEATURES ON A SUBSTRATE BY SELF-A...
- Publication number 20150380266
- Publication date Dec 31, 2015
- ASML NETHERLANDS B.V.
- Sander Frederik WUISTER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR PROVIDING SPACED LITHOGRAPHY FEATURES ON A SUBSTRATE BY...
- Publication number 20150380299
- Publication date Dec 31, 2015
- ASML NETHERLANDS B.V.
- Jozef Maria FINDERS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR PROVIDING SPACED LITHOGRAPHY FEATURES ON A SUBSTRATE BY...
- Publication number 20150364335
- Publication date Dec 17, 2015
- ASML NETHERLANDS B.V.
- Sander Frederik WUISTER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR PROVIDING LITHOGRAPHY FEATURES ON A SUBSTRATE BY SELF-A...
- Publication number 20150205197
- Publication date Jul 23, 2015
- ASML NETHERLANDS B.V.
- Jozef Maria Finders
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMPRINT LITHOGRAPHY METHOD AND APPARATUS
- Publication number 20150136324
- Publication date May 21, 2015
- ASML NETHERLANDS B.V.
- Sander Frederik WUISTER
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
METHODS FOR PROVIDING SPACED LITHOGRAPHY FEATURES ON A SUBSTRATE BY...
- Publication number 20150064915
- Publication date Mar 5, 2015
- ASML NETHERLANDS B.V.
- Sander Frederik Wuister
- B44 - DECORATIVE ARTS
Information Patent Application
METHODS AND COMPOSITIONS FOR PROVIDING SPACED LITHOGRAPHY FEATURES...
- Publication number 20150064630
- Publication date Mar 5, 2015
- ASML NETHERLANDS B.V.
- Sander Frederik Wuister
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
METHODS OF PROVIDING PATTERNED EPITAXY TEMPLATES FOR SELF-ASSEMBLAB...
- Publication number 20150050599
- Publication date Feb 19, 2015
- ASML NETHERLANDS B.V.
- Sander Frederik Wuister
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
METHODS OF PROVIDING PATTERNED TEMPLATES FOR SELF-ASSEMBLABLE BLOCK...
- Publication number 20150034594
- Publication date Feb 5, 2015
- ASML NETHERLANDS B.V.
- Harmeet Singh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Sander Frederik Wuister

Person

Patents Grantslast 30 patents

Imprint lithography

Systems and methods for reducing resist model prediction errors

Systems and methods for predicting layer deformation

Inspection tool and inspection method

Imprint lithography

Systems and methods for predicting layer deformation

Lithographic patterning process and resists to use therein

Method for controlling a manufacturing apparatus and associated app...

Imprint lithography

Imprint lithography

Method of designing lithography features by self-assembly of block...

Imprint lithography apparatus and method

Imprint lithography

Methodology to generate a guiding template for directed self-assembly

Methods for providing lithography features on a substrate by self-a...

Methods for providing patterned orientation templates for self-asse...

Lithographic patterning process and resists to use therein

Methods for providing lithography features on a substrate by self-a...

Methodology to generate guiding templates for directed self-assembly

Method to provide a patterned orientation template for a self-assem...

Imprint lithography alignment method and apparatus

Method of simulating formation of lithography features by self-asse...

Imprint lithography

Imprint lithography

Imprint lithography

Imprint lithography

Imprint lithography apparatus and method

Imprint lithography

Methods for providing lithography features on a substrate by self-a...

Lithographic apparatus, programmable patterning device and lithogra...

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR PREDICTING LAYER DEFORMATION

IMPRINT LITHOGRAPHY

IMPRINT LITHOGRAPHY

METHOD AND APPARATUS FOR FORMING A PATTERNED LAYER OF MATERIAL

INSPECTION TOOL AND INSPECTION METHOD

SYSTEMS AND METHODS FOR REDUCING RESIST MODEL PREDICTION ERRORS

SYSTEMS AND METHODS FOR PREDICTING LAYER DEFORMATION

METHOD FOR CONTROLLING A MANUFACTURING APPARATUS AND ASSOCIATED APP...

IMPRINT LITHOGRAPHY

Lithographic Patterning Process and Resists to Use Therein

RESIST COMPOSITIONS

IMPRINT LITHOGRAPHY

IMPRINT LITHOGRAPHY

Lithographic Patterning Process and Resists to Use Therein

METHODS FOR PROVIDING LITHOGRAPHY FEATURES ON A SUBSTRATE BY SELF-A...

IMPRINT LITHOGRAPHY

METHODOLOGY TO GENERATE A GUIDING TEMPLATE FOR DIRECTED SELF-ASSEMBLY

METHODOLOGY TO GENERATE GUIDING TEMPLATES FOR DIRECTED SELF-ASSEMBLY

IMPRINT LITHOGRAPHY APPARATUS AND METHOD

METHOD OF DESIGNING LITHOGRAPHY FEATURES BY SELF-ASSEMBLY OF BLOCK...

METHOD OF SIMULATING FORMATION OF LITHOGRAPHY FEATURES BY SELF-ASSE...

METHODS FOR PROVIDING LITHOGRAPHY FEATURES ON A SUBSTRATE BY SELF-A...

METHODS FOR PROVIDING SPACED LITHOGRAPHY FEATURES ON A SUBSTRATE BY...

METHODS FOR PROVIDING SPACED LITHOGRAPHY FEATURES ON A SUBSTRATE BY...

METHODS FOR PROVIDING LITHOGRAPHY FEATURES ON A SUBSTRATE BY SELF-A...

IMPRINT LITHOGRAPHY METHOD AND APPARATUS

METHODS FOR PROVIDING SPACED LITHOGRAPHY FEATURES ON A SUBSTRATE BY...

METHODS AND COMPOSITIONS FOR PROVIDING SPACED LITHOGRAPHY FEATURES...

METHODS OF PROVIDING PATTERNED EPITAXY TEMPLATES FOR SELF-ASSEMBLAB...

METHODS OF PROVIDING PATTERNED TEMPLATES FOR SELF-ASSEMBLABLE BLOCK...